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LM27 Datasheet(PDF) 2 Page - Texas Instruments

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Part # LM27
Description  LM27 SOT-23, 짹3째C Accurate, 120째C-150째C Factory Preset Thermostat
PDF  17 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

LM27 Datasheet(HTML) 2 Page - Texas Instruments

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LM27
V+
VTEMP
GND
HYST
OS, OS, US
or US
1
2
3
4
5
LM27
SNIS124D – AUGUST 2002 – REVISED JULY 2013
www.ti.com
Table 1. Summary Table of Trip Point and Output Function Capabilities of Released Parts(1)
Orderable Device
Trip Point Temperature (°C)
Digital Output Function
LM27CIM5-ZHJ
120
Active-Low, Open-Drain, OS output
LM27CIM5-1HJ
130
Active-Low, Open-Drain, OS output
LM27CIM5-2HJ
140
Active-Low, Open-Drain, OS output
(1)
Other device options have not been released to market, contact Texas Instruments for volume and other requirements for release.
Connection Diagram
PIN DESCRIPTIONS
Pin Number
Pin Name
Function
Connection
1
HYST
Hysteresis control, digital input
GND for 10°C or V+ for 2°C
2
GND
Ground, connected to the back side of
System GND
the die through lead frame.
3
VTEMP
Analog output voltage proportional to
Leave floating or connect to a high impedance node.
temperature
4
V+
Supply input
2.7V to 5.5V with a 0.1µF bypass capacitor. For PSRR
information see NOISE CONSIDERATIONS.
5(1)
OS
Overtemperature Shutdown open-drain Controller interrupt, system or power supply shutdown;
active low thermostat digital output
pull-up resistor
≥ 10kΩ
OS
Overtemperature Shutdown totem-pull
Controller interrupt, system or power supply shutdown
active high thermostat digital output
US
Undertemperature Shutdown open-
System or power supply shutdown; pull-up resistor
≥ 10kΩ
drain active low thermostat digital
output
US
Undertemperature Shutdown totem-
System or power supply shutdown
pull active high thermostat digital
output
(1)
Pin 5 functionality and trip point setting are programmed during LM27 manufacture.
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
2
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Copyright © 2002–2013, Texas Instruments Incorporated
Product Folder Links: LM27



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