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AD9675KBCZ Datasheet(PDF) 37 Page - Analog Devices

Part # AD9675KBCZ
Description  Octal Ultrasound AFE with JESD204B
PDF  61 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

AD9675KBCZ Datasheet(HTML) 37 Page - Analog Devices

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AD9675
Data Sheet
Rev. A | Page 36 of 60
Additional SPI options allow the user to further increase the
output driver voltage swing of all four outputs to drive longer
trace lengths (see Address 0x015 in Table 31). Even though this
produces sharper rise and fall times on the data edges and is less
prone to bit errors, the power dissipation of the DRVDD supply
increases when this option is used. See the Memory Map section
for more details.
Preemphasis
Preemphasis enables the receiver eye diagram mask to be met
in conditions where the interconnect insertion loss is not in
accordance with the JESD204B specification. In conditions
where pre-emphasis is not needed to achieve sufficient signal
integrity for the link, it is best to disable the pre-emphasis to
conserve power. Enabling pre-emphasis on a short link and
increasing the de-emphasis value too high may cause the
receiver eye diagram to fail in cases where it passes with no de-
emphasis. The transmitter eye diagram does not necessarily
pass when pre-emphasis is enabled. Furthermore, using more
pre-emphasis than necessary may increase EMI; therefore,
consider EMI when choosing an insertion loss compensation
strategy. To enable pre-emphasis, write a Logic 1 to
Address 0x015, Bit 1.
There are several methods to select test data patterns on the
JESD204B link, as shown in Figure 55. These methods serve
different purposes in the testing process of establishing the link.
The processed samples from the ADC can be replaced by nine
digital output test pattern options. The replacement is initiated
through the SPI using Address 0x00D, Bits[3:0]. These options
are useful when validating receiver capture and timing. See
Table 21 for the output test mode bit sequencing options. Some
test patterns have two serial sequential words, which the user
can alternate in various ways, depending on the test pattern
chosen. Note that some patterns may not adhere to the data
format select option. In addition, custom user defined test
patterns are assigned in the user pattern registers (Address 0x019
through Address 0x020). All test mode options except PN
sequence short and PN sequence long can support 8-bit to 14-bit
word lengths to verify data capture to the receiver.
The PN sequence short pattern produces a pseudorandom bit
sequence that repeats itself every 29 − 1 bits, or 511 bits. For a
description of the PN sequence short pattern and how it is
generated, see Section 5.1 of the ITU-T O.150 (05/96) standard.
The only difference from the standard is that the starting value
is a specific value instead of all 1s (see Table 20 for the initial
values).
The PN sequence long pattern produces a pseudorandom bit
sequence that repeats itself every 223 − 1 bits, or 8,388,607 bits.
For a description of the PN sequence long pattern and how it is
generated, see Section 5.6 of the ITU-T O.150 (05/96) standard.
The only differences from the standard are that the starting
value is a specific value instead of all 1s and that the AD9675
inverts the bit stream with relation to the ITU-T standard (see
Table 20 for the initial values). The output sample size depends on
the selected bit length.
Table 20. PN Sequence Initial Values
Sequence
Initial
Value
First Three Output Samples
(MSB First, 16-Bit)
PN Sequence Short
0x092
0x496F, 0xC9A9, 0x980C
PN Sequence Long
0x003
0xFF5C, 0x0029, 0xB80A
See the Memory Map section for information on how to change
these additional digital output timing features through the SPI.
Test patterns are initiated at the input of the scrambler block by
setting Address 0x144, Bits[5:4] = 10 or at the output of the 8-bit/
10-bit encoder by setting Address 0x144, Bits[5:4] = 01. The test
pattern generated is selected in Address 0x144, Bits[3:0], and is
specified in Table 22.



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