24 | Keysight | Infiniium DCA-X 86100D Wide-Bandwidth Oscilloscope Mainframe and Modules - Data Sheet

Software Applications

86100D-200 enhanced jitter analysis

Option 200 provides extensive and accurate jitter decomposition,

which is increasingly important as data rates increase and margins

reduce. Quickly customize your view of many parameters and take

advantage of advanced features such as jitter spectrum analysis.

86100D-201 advanced waveform analysis

Take advantage of powerful features in Option 201 to generate

much deeper waveform files, integrate MATLAB analysis, and use

equalizers (CTLE, LFE, DFE), User Operators and User Defined

Measurements.

86100D-202enhancedimpedanceandS-parameter

Option 202 works in TDR mode and provides live S-parameter

responses, including magnitude (return loss, insertion loss, etc.),

phase and group delay. Single-ended, differential and mixed-

mode responses are available simultaneously. Also enables quick

and easy saving of measurement results in Touchstone files (.s2p,

.s4p, etc.).

86100D-300 amplitude analysis/RIN/Q-factor

Extend the many capabilities from jitter mode into the amplitude

domain and see the decomposition of the amplitude into several

factors. Option 300 also reports relative intensity noise (RIN) and

Q-factor.

86100D-400 PLL and jitter spectrum

Option 400 quickly characterizes key parameters of phase-locked

loops and provides the jitter spectrum of your signal including

spread spectrum clocks. Control of the jitter source and receiver

is integrated to ensure fast results.

86100D-401 advanced EYE analysis

For device testing with long patterns and to obtain BER-contour

mask testing, Option 401 integrates with the classic or FlexDCA

interfaces to decompose the jitter and amplitude interference

measurements into the key parameters. When using the

embedded capability within FlexDCA or the included automation

application, you may characterize jitter on simultaneous multiple

lanes and obtain concise and visual results.

86100D-9FP PAM-N analysis software

Accurately and quickly analyze Pulse Amplitude Modulation

(PAM) signals as described in IEEE 802.3bj Clause 94 and

developing standards such as OIF-CEI-56G and IEEE 400G.

86100D-TFP IEEE TDECQ Analysis software

A lower cost subset of option 9FP capabilities that targets optical

Transmitter production test applications

86100D-SIM InfiniiSim-DCA

At higher data rates, the effect of measurement fixtures and

channels is prominent and can be accounted for through the

de-embedding capabilities within Option SIM. You may also view

measurements on live and simulated signals, allowing you to

compare design intent to actual performance.

N1012A OIF CEI compliance and debug application

The N1012A application lets you fully characterize the ~120 trans-

mitter test parameters (including 28G-VSR), reducing your test time

from hours to minutes. Included are return loss tests and several

utilities to improve your test productivity. Debug mode enables you

to characterize your devices well beyond the parameters prescribed

in the implementation agreements.

N1014A SFF-8431 compliance and debug

application

The N1014A application lets you fully characterize ~70 test

parameters including all transmitter tests for host, module and host

copper and all test signals for receiver testing. Return loss tests and

utilities are also included.

N1019A user-defined application

You may create your own test application or suite of tests using the

DCA-X and other instruments. Quickly and intuitively create groups

of tests, test descriptions, user prompts and test limits. Use concise

HTML reports to share your multiple test results with your users.

N1081-4A IEEE802.3 Ethernet applications

The extensive requirements for IEEE802.3-2012, 802.3bj and

802.3bm are covered in these four applications, which comprise

> 400 tests. Characterize your device for one, four or ten lanes, and

analyze trends over time/temperature and between devices.

N1085A PAM4 Ethernet and OIF-CEI

Measurement Application

The N1085A software application covers PAM-4 transmitter

measurements outlined in IEEE P802.3bs and four OIF-CEI-4.0

(56G) clauses.

86100D-BFP Automatic Fixture Removal (AFR)

When measuring physical layer devices with non-coaxial interfaces,

test fixtures or probes are often used to connect the device under

test (DUT) to the measurement equipment. For accurate measure-

ments of the DUT, the fixtures or probes need to be characterized

and their effects removed from the composite measurement of

the DUT plus test fixture or probe combination. This option adds

the Automatic Fixture Removal (AFR) capability from Keysight’s

powerful N1930B Physical Layer Test System (PLTS) software to

help you characterize a fixture or probe with non-coaxial interfaces.

Fixtures and probes to be characterized can be single-ended or

differential.