| Electronic Components Datasheet Search |
|
LTC3859AL Datasheet(PDF) 6 Page - Linear Technology |
|
|
|||||||||||||||||||||||||||||
LTC3859AL Datasheet(HTML) 6 Page - Linear Technology |
|
6 / 38 page ![]() LTC3899 6 3899fa For more information www.linear.com/LTC3899 ELECTRICAL CHARACTERISTICS Note 1: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to any Absolute Maximum Ratings for extended periods may affect device reliability and lifetime. Note 2: The LTC3899 is tested under pulsed load conditions such that TJ ≈ TA. The LTC3899E is guaranteed to meet performance specifications from 0°C to 85°C. Specifications over the –40°C to 125°C operating junction temperature range are assured by design, characterization and correlation with statistical process controls. The LTC3899I is guaranteed over the –40°C to 125°C operating junction temperature range, the LTC3899H is guaranteed over the –40°C to 150°C operating junction temperature range, and the LTC3899MP is tested and guaranteed over the –55°C to 150°C operating junction temperature range. High junction temperatures degrade operating lifetimes; operating lifetime is derated for junction temperatures greater than 125°C. Note that the maximum ambient temperature consistent with these specifications is determined by specific operating conditions in conjunction with board layout, the rated package thermal impedance and other environmental factors. The junction temperature (TJ, in °C) is calculated from the ambient temperature (TA, in °C) and power dissipation (PD, in Watts) according to the formula: TJ = TA + (PD • θJA) where θJA = 34°C/W for the QFN package and where θJA = 25°C/W for the TSSOP package. Note 3: This IC includes overtemperature protection that is intended to protect the device during momentary overload conditions. The maximum rated junction temperature will be exceeded when this protection is active. Continuous operation above the specified absolute maximum operating junction temperature may impair device reliability or permanently damage the device. Note 4: The LTC3899 is tested in a feedback loop that servos VITH1,2,3 to a specified voltage and measures the resultant VFB1,2,3. The specification at 85°C is not tested in production and is assured by design, characterization and correlation to production testing at other temperatures (125°C for the LTC3899E and LTC3899I, 150°C for the LTC3899H and LTC3899MP). For the LTC3899I and LTC3899H, the specification at 0°C is not tested in production and is assured by design, characterization and correlation to production testing at –40°C. For the LTC3899MP, the specification at 0°C is not tested in production and is assured by design, characterization and correlation to production testing at –55°C. Note 5: Dynamic supply current is higher due to the gate charge being delivered at the switching frequency. See Applications information. Note 6: Rise and fall times are measured using 10% and 90% levels. Delay times are measured using 50% levels Note 7: The minimum on-time condition is specified for an inductor peak-to-peak ripple current >40% of IMAX (See Minimum On-Time Considerations in the Applications Information section). Note 8: Do not apply a voltage or current source to these pins. They must be connected to capacitive loads only, otherwise permanent damage may occur. |
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |