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ADF5610 Datasheet(PDF) 21 Page - Analog Devices

Part # ADF5610
Description  Fractional-N PLL with Integrated VCO
PDF  48 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADF5610 Datasheet(HTML) 21 Page - Analog Devices

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Preliminary Technical Data
ADF5610
Rev. PrE | Page 21 of 48
where:
NINT is the integer set in Register 0x03.
NFRAC is the fractional part set in Register 0x04.
The autocalibration state machine and the data transfers to the
internal VCO VSPI run at the rate of the FSM clock, tFSM, where
the FSM clock frequency cannot be greater than 50 MHz.
tFSM = tXTAL × 2m
(3)
where m is 0, 2, 4, or 5 as determined by Register 0x0A[14:13].
The expected number of VCO counts, V, is given by
V = floor (N × 2n)
(4)
The nominal VCO frequency measured, fVCOM, is given by
fVCOM = V × fXTAL/(2n × R)
(5)
where the worst case measurement error, fERR, is
fERR ≈ ±fPD/2n + 1
(6)
For example, the autocalibration time (tcal) for an 8-bit step
tuned VCO (where the total number of bits includes those
needed to switch VCO cores) is as follows. First a 20 * (k+1) bit
wait state occurs. The measurement has a programmable
number of wait states, k, of 128 FSM cycles defined by Register
0x0A[7:6] = k. Wideband VCO’s like the ADF5610 require
additional wait time (typically, k = 1) whereas narrowband
VCO’s may be fine setting k =0. The wait period is followed by
the measurement time (Tmmt) for calibration then VSPI data
transfers of 20 clock cycles each. This repeats 8 times since we
have 1 bit to select the VCO core and 7 bits to select the VCO
band for a total of 8 bits. Total calibration time, worst case, is
given by
tCAL = k128 tFSM + 8tPD 2n + 8 × 20 tFSM
(7)
or equivalently
tCAL = tXTAL (8R × 2n + (160 + (k × 128)) × 2m)
(8)
For guaranteed hold of lock, across temperature extremes, the
resolution must be better than 1/8th of the frequency step caused
by a VCO sub-band switch change. Better resolution settings
show no improvement.
VCO Autocalibration Example
The VCO subsystem must satisfy the maximum fPD limited by
the two following conditions:
N ≥ 16 (fINT), N ≥ 20.0 (fFRAC)
where:
N = fVCO/fPD. fPD ≤ 100 MHz.
fINT is integer mode.
fFRAC is fractional-N mode. The minimum N values changes
depending on the operating mode.
For example, if the VCO subsystem output frequency is to
operate at 7.01 GHz and the crystal frequency is fXTAL = 50 MHz,
R = 1, and m = 2 (see Figure 25), then tFSM = 80 ns (12.5 MHz).
When using autocalibration, the maximum autocalibration
FSM clock cannot exceed 50 MHz (see Register 0x0A[14:13]).
The FSM clock does not affect the accuracy of the measure-
ment; it only affects the time to produce the result. This same
clock clocks the 16-bit VCO serial port.
If the time to change frequencies is not a concern, the
calibration time for maximum accuracy can be set and,
therefore, the measurement resolution is of no concern.
Using an input crystal of 50 MHz (R = 1 and fPD = 50 MHz), the
times and accuracies for calibration using Equation 6 and
Equation 8 are listed in Table 7, where minimal tuning time is
1/8th of the VCO band spacing.
Figure 25. VCO Calibration
Table 7. Auto-calibration Example with fXTAL = 50 MHz, R = 1, m = 2
Control Value Register 0x0A[2:0]
n
2n
tMMT (μs)
tCAL (μs)
fERR Maximum
0
0
1
0.02
33.44
±25 MHz
1
1
2
0.04
33.60
±12.5 MHz
2
2
4
0.08
33.92
±6.25 MHz
3
3
8
0.16
34.56
±3.125 MHz
4
5
32
0.64
38.40
±781 kHz
XREF
CALIBRATION WINDOW
REG 0x02
START
V
VCO
CTR
FSM
50MHz MAX FOR
FSM + VSPI CLOCKS
REG 0x0A[14:13]
m = [0, 2, 4, 5]
REG 0x0A[2:0]
n = [0, 1, 2, 3, 5, 6, 7, 8]
STOP
tMMT = tXTAL × R × 2n
tPD
÷ 2n
÷ 2m
÷ R



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