ADAV801ASTZ datasheet(3/56 Pages) AD

3 / 56 page

ADAV801

Rev. 0 | Page 3 of 56

SPECIFICATIONS

TEST CONDITIONS

Test conditions, unless otherwise noted.

Table 1.

Test Parameter

Condition

Supply Voltage

Analog

3.3 V

Digital

3.3 V

Ambient Temperature

25°C

Master Clock (XIN)

12.288 MHz

Measurement Bandwidth

20 Hz to 20 kHz

Word Width (All Converters)

24 bits

Load Capacitance on Digital Outputs

100 pF

ADC Input Frequency

1007.8125 Hz at −1 dBFS

DAC Output Frequency

960.9673 Hz at 0 dBFS

Digital Input

Slave Mode, I2S Justified Format

Digital Output

Slave Mode, I2S Justified Format

ADAV801 SPECIFICATIONS

Table 2.

Parameter

Min

Typ

Max

Unit

Comments

PGA SECTION

Input Impedance

kΩ

Minimum Gain

Maximum Gain

Gain Step

0.5

REFERENCE SECTION

Absolute Voltage, VREF

1.5

VREF Temperature Coefficient

ppm/°C

ADC SECTION

Number of Channels

Resolution

Bits

Dynamic Range

−60 dB input

Unweighted

fS = 48 kHz

fS = 96 kHz

A-Weighted

102

fS = 48 kHz

101

fS = 96 kHz

Total Harmonic Distortion plus Noise

Input = −1.0 dBFS

−88

fS = 48 kHz

−87

fS = 96 kHz

Analog Input

Input Range (± Full Scale)

1.0

V rms

DC Accuracy

Gain Error

−1.5

−0.8

Interchannel Gain Mismatch

0.05

Gain Drift

mdB/°C

Offset

−10

Crosstalk (EIAJ Method)

−110

Volume Control Step Size (256 Steps)

0.39

% per

step

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