TLE8458

Application Information

Data Sheet

28

Rev. 1.1, 2014-04-01

8.1

ESD Tests

Test for ESD robustness according to IEC61000-4-2 “Gun test” (150 pF, 330

Ω) have been performed. The results

and test conditions are available in a separate test report (see Table 13).

8.1.1

EMC Measurement

The EMC performance has been qualified by an external test house according to the LIN EMC Test specification

Version 1.0 (August 1, 2004). For the DPI measurements according to the LIN EMC Test Specification, Section

4.2 (ISO62132 part 1: 2006, ISO62132 part 4: 2006) the verification limit for the output voltage

V

CC, was set to a

limit of +/- 100 mV. External test reports are available on request.

8.2

Pin Compatibility to Stand-Alone LIN transceivers

The TLE8458G is pin - and function compatible to the single LIN transceivers like the TLE7259-3GE (see

Figure 16). Instead of the INH output pin on the single LIN transceiver TLE7259-3GE the

V

CC power supply output

can be connected to the external microcontroller. The TLE8458G provides the same operation modes and

features as single LIN transceiver TLE7259-3GE.

Figure 16

Pinning of TLE8458G versus the TLE7259-3GE

Table 13

ESD “Gun test”

Parameter

Symbol

Values

Unit

Note /

Test Condition

Number

Min.

Typ.

Max.

Performed Test

ESD at

V

S, LIN versus GND

V

ESD,GUN -10

–

10

kV

GUN1)

1) ESD susceptibility “ESD GUN” according LIN EMC Test Specification, Section 3.4.3 (IEC 61000-4-2:2001-12),

tested by external test house (IBEE Zwickau, EMC Test report Nr. 05-12-13a)

P_8.1.1

ESD at WK PIN

V

ESD,GUN -6

–

6

kV

GUN1)

P_8.1.1

RxD

1

2

3

45

6

7

8

EN

WK

TxD

VS

LIN

GND

VCC

RxD

1

2

3

45

6

7

8

EN

WK

TxD

VS

LIN

GND

INH

TLE8458G

TLE7259-3GE