TLE8458

General Product Characteristics

Data Sheet

6

Rev. 1.1, 2014-04-01

4

General Product Characteristics

4.1

Absolute Maximum Ratings

Notes

1. Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability.

2. Integrated protection functions are designed to prevent IC destruction under fault conditions described in the

data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are not

designed for continuous repetitive operation.

Table 2

Absolute Maximum Ratings 1)

All voltages with respect to ground, positive current flowing into pin

(unless otherwise specified)

1) Not subject to production test; specified by design.

Parameter

Symbol

Values

Unit

Note /

Test Condition

Number

Min.

Typ.

Max.

Voltages

Supply Voltage on

V

S pin

V

S

-0.3

–

40

V

LIN2.1 Param 11 P_4.1.1

Input Voltage on LIN, WK pin versus

GND

V

LIN,G

-40

–

40

V

–

P_4.1.2

Logic Voltages at EN, TxD, RxD pin

V

L,max

-0.3

–

5.5

V

–

P_4.1.3

Output Voltage at

V

CC pin

V

CC

-0.3

–

5.5

V

Static

P_4.1.4

Temperatures

Junction Temperature

T

j

-40

–

150

°C

–

P_4.1.5

Storage Temperature

T

stg

-55

–

150

°C

–

P_4.1.6

ESD Resistivity

ESD all pins

V

ESD,HBM -2

–

2

kV

HBM2)

2) ESD susceptibility, HBM according to ANSI/ESDA/JEDEC JS-001 (1.5 kΩ, 100pF)

P_4.1.7

ESD

V

S, WK, LIN versus GND

V

ESD,HBM -8

–

8

kV

HBM2)

P_4.1.8

ESD Resistivity all pins versus GND

V

ESD,CDM -750

–

750

V

CDM3)

3) ESD susceptibility, Charged Device Model “CDM” EIA / JESD 22-C101 or ESDA STM5.3.1

P_4.1.9