- 11 -

Ver.6

http://www.njr.com/

NJU77240/NJU77241/NJU77242

■ TYPICAL TEST CIRCUIT

●Supply Current

(ISUPPLY)

・

V

+=3V,V－=0V,Vcom=0V, VID=100m V

・

V

+=3V,V－=0V,Vcom=3V, VID=100mV

●Output Leakage Current

(ILEAK)

●Low-level Output Voltage (VOL)

・

V

+=3V,V－=0V, VID=100m V, Vo=3V

・

V

+=3V,V－=0V,ISINK=3mA,VID=100mV

●Propagation Delay (tPLH, tPHL), Output Signal Rising Time (tTLH), Output Signal Falling Time (tTHL)

・

V

+=3V,V－=0V,VCOM=0V,RL=5.1kΩ,CL=15pF,Over drive=100mV

V ID

V

COM

V+

A

V

ID

V+

A

Input Wave Form

(Rise Measurement)

100mV

Over

Drive

Input Wave Form

(Fall Measurement)

100mV

Over

Drive

V

IN

VCOM

V+

CL

RL

V

ID

V+

V

ISINK

VCOM

VCOM