Data Sheet

ADM3095E

Rev. C | Page 13 of 19

Figure 33 shows the 8 kV contact discharge current waveform

as described in the Specifications section. Some of the key

waveform parameters are rise times of less than 1 ns and pulse

widths of approximately 60 ns.

tR = 0.7ns TO 1ns

IPEAK

I30ns

I60ns

30A

90%

16A

8A

10%

30ns

60ns

TIME

Figure 33. IEC 61000-4-2 ESD Waveform (8 kV)

Figure 34 shows the 8 kV contact discharge current waveform

from the IEC 61000-4-2 standard compared to the hHBM ESD

8 kV waveform. The two standards specify a different waveform

shape and peak current. The peak current associated with an

IEC 61000-4-2 8 kV pulse is 30 A, while the corresponding

peak current for HBM ESD is more than five times less at 5.33

A. The other difference is the rise time of the initial voltage

spike, with IEC 61000-4-2 ESD having a much faster rise time

of 1 ns, compared to the 10 ns associated with the HBM ESD

waveform. The amount of power associated with an IEC 61000-

4-2 ESD waveform is much greater than that of an HBM ESD

waveform (see Figure 34).

tR = 0.7ns TO 1ns

IPEAK

I30ns

I60ns

30A

90%

16A

8A

5.33A

10%

30ns

10ns

60ns

TIME

IEC 61000-4-2 ESD 8kV

HBM ESD 8kV

Figure 34. IEC 61000-4-2 ESD Waveform (8 kV) compared to the HBM ESD

Waveform (8 kV)

These factors combined mean that it is strongly recommended for

system designers to choose devices such as the ADM3095E with

IEC 61000-4-2 ESD ratings for operation in harsh environments,

rather than some competitive devices, which state varying levels

of HBM ESD protection. Table 7 summarizes the IEC 61000-4-2

ESD certified test results. Testing was performed in normal trans-

ceiver operation with the ADM3095E clocking data at 2.0 Mbps

See Figure 35 for the IEC 61000-4-2 ESD testing diagram.

Table 7. IEC 61000-4-2 Certified Test Results

ESD Gun

Connected to

IEC 61000-4-2 Test Result

Certified Result

GND

±15 kV (air), ±8 kV (contact),

Level 4 protection

Yes

R

D

RxD

RE

DE

TxD

A

B

VCC

ADM3095E

EMC

TRANSIENT

PROTECTION

CIRCUIT

GND

VIO

LEVEL

TRANSLATOR

IEC ESD

GUN

Figure 35. IEC 61000-4-2 ESD Testing Diagram

Electrical Fast Transients (EFT)

EFT testing involves coupling a number of extremely fast transient

impulses onto the signal lines to represent transient disturbances

associated with external switching circuits that are capacitively

coupled onto the communication ports, which can include relay

and switch contact bounce or transients originating from the

switching of inductive or capacitive loads—all of which are very

common in industrial environments. The EFT test defined in

IEC 61000-4-4 attempts to simulate the interference resulting from

these types of events.

Figure 36 shows the EFT 50 Ω load waveform. The EFT waveform

is described in terms of a voltage across 50 Ω impedance from a

generator with 50 Ω output impedance. The output waveform

consists of a 15 ms burst of 2.5 kHz to 5 kHz high voltage transients

repeated at 300 ms intervals (see Figure 36). Each individual pulse

has a rise time of 5 ns and pulse duration of 50 ns, measured

between the 50% point on the rising and falling edges of the

waveform.