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33903 Datasheet(PDF) 30 Page - NXP Semiconductors |
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33903 Datasheet(HTML) 30 Page - NXP Semiconductors |
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30 / 107 page  30 NXP Semiconductors 33903/4/5 ELECTRICAL CHARACTERISTICS . Figure 17. Test circuit for CAN timing characteristics Figure 18. LIN timing measurements for normal slew rate VSUP 12 V CANL 22 μF 10 μF SPLIT GND TXD RXD Signal generator All pins are not shown RBUS 15 pF CBus 100 pF 60 Ω 100 nF 5 V_CAN CANH TXD LIN RXD tBIT tBIT tBUS_DOM(MAX) tBUS_REC(MIN) tREC_PDF(1) 74.4% VSUP 42.2% VSUP 58.1% VSUP 28.4% VSUP tBUS_REC(MAX) VLIN_REC tBUS_DOM(MIN) RXD Output of receiving Node 1 Output of receiving Node 2 THREC(MAX) THDOM(MAX) THREC(MIN) THDOM(MIN) Thresholds of receiving node 1 Thresholds of receiving node 2 tREC_PDR(1) tREC_PDF(2) tREC_PDR(2) |
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