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BSH299 Datasheet(PDF) 4 Page - NXP Semiconductors |
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BSH299 Datasheet(HTML) 4 Page - NXP Semiconductors |
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4 / 12 page ![]() 1998 Feb 18 4 Philips Semiconductors Objective specification P-channel enhancement mode MOS transistor BSH299 CHARACTERISTICS Tj =25 °C unless otherwise specified. SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT V(BR)DSS drain-source breakdown voltage VGS = 0; ID = −10 µA −50 −− V VGSth gate-source threshold voltage VGS =VDS; ID = −1mA −0.8 −−2V IDSS drain-source leakage current VGS = 0; VDS = −40 V −−−100 nA VGS = 0; VDS = −50 V −−−10 µA VGS = 0; VDS = −50 V; Tj = 125 °C −−−60 µA IGSS gate leakage current VGS = ±20 V; VDS =0 −−±10 nA RDSon drain-source on-state resistance VGS = −10 V; ID = −0.13 A; see Fig.10 −− 10 Ω y fs forward transfer admittance VDS = −25 V; ID = −0.13 A 50 −− mS Ciss input capacitance VGS = 0; VDS = −25 V; f = 1 MHz; see Fig.7 − 25 45 pF Coss output capacitance − 15 25 pF Crss reverse transfer capacitance − 3.5 12 pF Switching times (see Figs 5 and 6) ton turn-on switching time VGS =0to −10 V; VDD = −40 V; ID = −0.2 A − 3 − ns toff turn-off switching time VGS = −10 to 0 V; VDD = −40 V; ID = −0.2 A − 7 − ns |
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