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TLV709 Datasheet(PDF) 4 Page - Texas Instruments |
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TLV709 Datasheet(HTML) 4 Page - Texas Instruments |
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4 / 31 page ![]() 6 Specifications 6.1 Absolute Maximum Ratings over operating temperature range (unless otherwise noted)(1) (2) MIN MAX UNIT Voltage VIN –0.3 30 V VOUT (for fixed device only) –0.3 2 × VOUT(typ) or VIN + 0.3 or 5.5 (whichever is lower) VOUT (for adjustable device only) –0.3 VIN + 0.3 VFB –0.3 2.4 Current Peak output current Internally limited Temperature Junction, TJ –40 150 °C Storage, Tstg –65 150 (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltage values are with respect to the ground terminal. 6.2 ESD Ratings VALUE UNIT V(ESD) Electrostatic discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1) ±2000 V Charged device model (CDM), per JEDEC specification JESD22-C101, all pins(2) ±500 (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted)(1) MIN NOM MAX UNIT VIN Input supply voltage 2.5 30 V VOUT Output voltage (for adjustable device only) 1.205 28 Output voltage (for fixed device only) 1.205 5.0 IOUT Output current 0 150 mA CIN Input capacitor(2) 0.47 µF COUT Output capacitor(3) 1 TJ Operating junction temperature –40 125 °C (1) All voltages are with respect to GND. (2) An input capacitor is not required for LDO stability. However, an input capacitance with an effective value of 0.1 μF minimum is recommended to counteract the effect of source resistance and inductance, which may in some cases cause symptoms of systemlevel instability such as ringing or oscillation, especially in the presence of load transients. (3) All capacitor values listed are the nominal value and the effective capacitance is assumed to derate to 50% of the nominal capacitor value. TLV709 SLVSGU2B – FEBRUARY 2023 – REVISED JUNE 2023 www.ti.com 4 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated Product Folder Links: TLV709 |
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