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TLV709 Datasheet(PDF) 11 Page - Texas Instruments |
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TLV709 Datasheet(HTML) 11 Page - Texas Instruments |
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11 / 31 page ![]() 7.3 Feature Description 7.3.1 Wide Supply Range This device has an operational input supply range of 2.5 V to 30 V, allowing for a wide range of applications. This wide supply range is designed for applications that have either large transients or high DC voltage supplies. 7.3.2 Low Quiescent Current This device only requires 3.2 μA (typical) of quiescent current across the complete load current range (0 mA to 150 mA) at room temperature and 4.8 μA (max) across the temperature range of –40°C to +125°C. 7.3.3 Dropout Voltage (VDO) Dropout voltage (VDO) is defined as the input voltage minus the output voltage (VIN – VOUT) at the rated output current (IRATED), where the pass transistor is fully on. IRATED is the maximum IOUT listed in the Recommended Operating Conditions table. In dropout operation, the pass transistor is in the ohmic or triode region of operation, and acts as a switch. The dropout voltage indirectly specifies a minimum input voltage greater than the nominal programmed output voltage at which the output voltage is expected to stay in regulation. If the input voltage falls to less than the value required to maintain output regulation, then the output voltage falls as well. For a CMOS regulator, the dropout voltage is determined by the drain-source, on-state resistance (RDS(ON)) of the pass transistor. Therefore, if the linear regulator operates at less than the rated current, the dropout voltage for that current scales accordingly. Use Equation 1 to calculate the RDS(ON) of the device. (1) 7.3.4 Current Limit The device has an internal current limit circuit that protects the regulator during transient high-load current faults or shorting events. The current limit is a brick-wall scheme. In a high-load current fault, the brick-wall scheme limits the output current to the current limit (ICL). ICL is listed in the Electrical Characteristics table. The output voltage is not regulated when the device is in current limit. When a current limit event occurs, the device begins to heat up because of the increase in power dissipation. When the device is in brick-wall current limit, the pass transistor dissipates power [(VIN – VOUT) × ICL]. For more information on current limits, see the Know Your Limits application note. Figure 7-3 shows a diagram of the current limit. VOUT(NOM) 0 V 0 mA VOUT ICL IRATED IOUT Brickwall Figure 7-3. Current Limit www.ti.com TLV709 SLVSGU2B – FEBRUARY 2023 – REVISED JUNE 2023 Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 11 Product Folder Links: TLV709 |
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