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AM29LV033C Datasheet(PDF) 44 Page - Advanced Micro Devices |
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AM29LV033C Datasheet(HTML) 44 Page - Advanced Micro Devices |
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44 / 49 page ![]() 42 Am29LV033C 22268B5 September 12, 2006 DA TA SH EET ERASE AND PROGRAMMING PERFORMANCE Notes: 1. Typical program and erase times assume the following conditions: 25 °C, 3.0 V V CC, 1,000,000 cycles. Additionally, programming typicals assume checkerboard pattern. 2. Under worst case conditions of 90°C, V CC = 2.7 V, 1,000,000 cycles. 3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes program faster than the maximum program times listed. 4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure. 5. System-level overhead is the time required to execute the four- or two-bus-cycle sequence for the program command. See Table 9, on page 25 for further information on command definitions. 6. The device has a guaranteed minimum erase and program cycle endurance of 1,000,000 cycles. LATCHUP CHARACTERISTICS Includes all pins except V CC. Test conditions: VCC = 3.0 V, one pin at a time. TSOP PIN CAPACITANCE Notes: 1. Sampled, not 100% tested. 2. Test conditions T A = 25°C, f = 1.0 MHz. DATA RETENTION Parameter Typ (Note 1) Max (Note 2) Unit Comments Sector Erase Time 0.7 15 s Excludes 00h programming prior to erasure (Note 4) Chip Erase Time 45 s Byte Programming Time 9 300 µs Excludes system level overhead (Note 5) Accelerated Byte Program Time 7 210 µs Chip Programming Time (Note 3) 36 108 s Description Min Max Input voltage with respect to V SS on all pins except I/O pins (including A9, OE#, and RESET#) –1.0 V 12.5 V Input voltage with respect to V SS on all I/O pins –1.0 V V CC + 1.0 V V CC Current –100 mA +100 mA Parameter Symbol Parameter Description Test Setup Typ Max Unit C IN Input Capacitance V IN = 0 6 7.5 pF C OUT Output Capacitance V OUT = 0 8.5 12 pF C IN2 Control Pin Capacitance V IN = 0 7.5 9 pF Parameter Test Conditions Min Unit Minimum Pattern Data Retention Time 150 °C 10 Years 125 °C 20 Years |
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