MBM29F400TC datasheet(25/48 Pages) SPANSION

25 / 48 page

MBM29F400TC-55/-70-90/MBM29F400BC-55/-70-90

s AC CHARACTERISTICS

• Read Only Operations Characteristics

*1: Test Conditions:

Output Load: 1 TTL gate and 30 pF

Input rise and fall times: 5 ns

Input pulse levels: 0.0 V or 3.0 V

Timing measurement reference level

Input: 1.5 V

Output: 1.5 V

Parameter

Symbol

Test

Setup

-55 *1

-70 *2

-90 *2

Unit

JEDEC Standard

Min

Max

Min

Max

Min

Max

Read Cycle Time

tAVAV

tRC

—55



Address to Output Delay

tAVQV

tACC

CE = VIL

OE = VIL



Chip Enable to Output Delay

tELQV

tCE

OE = VIL



Output Enable to Output Delay

tGLQV

tOE

—



Chip Enable to Output High-Z

tEHQZ

tDF

—



Output Enable to Output High-Z

tGHQZ

tDF

—



Output Hold Time From Addresses,

CE or OE, Whichever Occurs First

tAXQX

tOH

—0



RESET Pin Low to Read Mode

—

tREADY

—



µs

CE or BYTE Switching Low or High

—

tELFL

tELFH

—



5ns

Test Conditions

5.0 V

Diode = 1N3064

or Equivalent

2.7 k

Ω

Device

Under

Test

Diode = 1N3064

or Equivalent

6.2 k

Ω

Notes:

• CL = 30 pF including jig capacitance (MBM29F400TC/BC-55)

• CL = 100 pF including jig capacitance (MBM29F400TC/BC-70/90)

*2: Test Conditions:

Output Load: 1 TTL gate and 100 pF

Input rise and fall times: 5 ns

Input pulse levels: 0.45 V or 2.4 V

Timing measurement reference level

Input: 0.8 V and 2.0 V

Output: 0.8 V and 2.0 V

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