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33887 Datasheet(PDF) 34 Page - Freescale Semiconductor, Inc |
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33887 Datasheet(HTML) 34 Page - Freescale Semiconductor, Inc |
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34 / 37 page ![]() Analog Integrated Circuit Device Data 34 Freescale Semiconductor 33887 ADDITIONAL DOCUMENTATION THERMAL ADDENDUM (REV 2.0) Figure 26. Thermal Test Board Device on Thermal Test Board RθJA is the thermal resistance between die junction and ambient air. RθJS is the thermal resistance between die junction and the reference location on the board surface near a center lead of the package (see Figure 26). EN AGND IN2 D1 CCP V+ OUT2 OUT2 D2 PGND PGND FS V+ OUT1 OUT1 FB PGND PGND IN1 V+ 1 2 3 4 5 6 7 8 9 10 20 19 16 15 14 13 12 11 18 17 Tab Tab 33887 Pin Connections 20-Pin HSOP-EP 1.27 mm Pitch 16.0 mm x 11.0 mm Body 12.2 mm x 6.9 mm Exposed Pad A Material: Single layer printed circuit board FR4, 1.6 mm thickness Cu traces, 0.07 mm thickness Outline: 80 mm x 100 mm board area, including edge connector for thermal testing Area A: Cu heat spreading areas on board surface Ambient Conditions: Natural convection, still air Table 8. Thermal Resistance Performance Thermal Resistance Area A (mm2) °C/W RθJA 0.0 52 300 36 600 32 RθJS 0.0 10 300 7.0 600 6.0 |
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