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SCN68562 Datasheet(PDF) 9 Page - NXP Semiconductors |
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SCN68562 Datasheet(HTML) 9 Page - NXP Semiconductors |
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9 / 18 page ![]() Philips Semiconductors Product specification SCN68562 Dual universal serial communications controller (DUSCC) 1995 May 01 9 NO. UNIT LIMITS PARAMETER FIGURE NO. UNIT Max Typ Min PARAMETER FIGURE 42 16 CSN Low to transmit DMA REQ negated 400 nS 43 16 CSN Low to receive DONEN Low 300 nS 44 16 CSN Low to receive DMA REQ negated 400 nS NOTES: 1. Parameters are valid over specified temperature range. 2. All voltage measurements are referenced to ground (GND). For DC and functional testing, all inputs except X1/CLK swing between 0.8V and 2.0V with a transition time of 20ns maximum. For X1/CLK, this swing is between 0.4V and 2.4V All time measurements are referenced at input voltages of 0.4V and 2.4V for all inputs. Output levels are referenced at 1.2V and 2.0V, as appropriate. 3. Test conditions for outputs: CL = 150pF, except open-drain outputs. Test condition for open-drain outputs: CL = 50pF to GND, RL = 2.7kΩ to VCC except DTACKN whose RL = 820Ω to VCC and CL = 150pF to GND and DONEN which requires CL = 50pF to GND and RL = 1kΩ to VCC. 4. This specification will impose maximum 68000 CPU CLK to 6MHz. Higher CPU CLK can be used if repeating bus cycles are not performed. 5. Execution of the valid command (after it is latched) requires three falling edges of X1 (see Figure 14). 6. In single address DMA mode write operation, data is latched by the falling edge of DTCN. 7. These values were not explicitly tested, they are guaranteed by design and characterization data. 8. These timings are from the falling edge of DTACKN (not CSN rising). 9. X1/CLK frequency must be at least four times the receiver serial data rate. 1 RESETN SD00224 Figure 3. Reset Timing A1–A6 R/WN CSN D0–D7 DTACKN 2 3 5 4 6 8 9 11 7 12 13 14 SD00225 Figure 4. Bus Timing (Read Cycle) X1/CLK DTACKN COMMAND VALID SD00226 Figure 5. Command Timing |
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