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IL422 Datasheet(PDF) 7 Page - NVE Corporation

Part # IL422
Description  Isolated RS422/RS485 Interface
PDF  12 Pages
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Manufacturer  NVE [NVE Corporation]
Direct Link  https://www.nve.com/
Logo NVE - NVE Corporation

IL422 Datasheet(HTML) 7 Page - NVE Corporation

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IL422
7
NVE Corporation
11409 Valley View Road, Eden Prairie, MN 55344-3617
Phone: (952) 829-9217
www.nve.com
youtube.com/NveCorporation
iso-apps@nve.com
Insulation Specifications
Parameters
Symbol
Min.
Typ.
Max.
Units
Test Conditions
Creepage Distance
8.08
mm
Barrier Impedance
>1014||7
Ω
|| pF
Leakage Current
0.2
μ
A
240 VRMS, 60 Hz
Thermal Characteristics
Parameter
Symbol
Min.
Typ.
Max.
Units
Test Conditions
Junction–Ambient Thermal Resistance
θ
JA
67
°C/W
Double-sided PCB in
free air
Junction–Case (Top)
Thermal Resistance
θ
JC
12
Junction–Ambient
Thermal Resistance
θ
JA
46
2s2p PCB in free air
per JESD51
Junction–Case (Top)
Thermal Resistance
θ
JC
9
Power Dissipation
PD
1500
mW
Notes:
1.
All voltage values are with respect to network ground except differential I/O bus voltages.
2.
Differential input/output voltage is measured at the noninverting terminal A with respect to the inverting terminal B.
3.
Skew limit is the maximum propagation delay difference between any two devices at 25°C.
4.
The power-off measurement in ANSI Standard EIA/TIA-422-B applies to disabled outputs only and
is not applied to combined inputs and outputs.
5.
All typical values are at VDD1= 3.3 V or 5 V and VDD2 = 5 V, and TA = 25°C.
6.
The minimum VOD2 with a 100 Ω load is either ½ VOD1 or 2 V, whichever is greater.
7.
Δ
|VOD| and Δ|VOC| are the changes in magnitude of VOD and VOC, respectively,
that occur when the input is changed form one logic state to the other.
8.
This applies for both power on and power off, refer to ANSI standard RS-485 for exact condition.
The EIA/TIA-422-B limit does not apply for a combined driver and receiver terminal.
9.
Includes 8 ns read enable time. Maximum propagation delay is 25 ns after read assertion.
10. Pulse skew is defined as |tPLH − tPHL| of each channel.
11. The relevant test and measurement methods are given in the Electromagnetic Compatibility section.
12. External magnetic field immunity is improved by this factor if the field direction is “end-to-end” rather than to “pin-to-pin.”



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