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TPL5010

SNAS651A – JANUARY 2015 – REVISED SEPTEMBER 2018

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Copyright © 2015–2018, Texas Instruments Incorporated

(1)

Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in

very limited self-heating of the device such that TJ = TA. No specification of parametric performance is indicated in the electrical tables

under conditions of internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond which

the device may be permanently degraded, either mechanically or electrically.

(2)

Limits are specified by testing, design, or statistical analysis at 25°C. Limits over the operating temperature range are specified through

correlations using statistical quality control (SQC) method.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped

production material.

(4)

The supply current excludes load and pullup resistor current. Input pins are at GND or VDD.

(5)

The accuracy for time interval settings below 1 second is ±100 ms.

(6)

This parameter is specified by design and/or characterization and is not tested in production.

(7)

Operational life time test procedure equivalent to 10 years.

7.5 Electrical Characteristics

(1)

Specifications are for TA= 25°C, VDD-GND = 2.5 V, unless otherwise stated.

PARAMETER

TEST CONDITIONS

MIN(2)

TYP(3)

MAX(2)

UNIT

POWER SUPPLY

IDD

Supply current(4)

Operation mode

35

50

nA

Digital conversion of external

resistance (Rext)

200

400

µA

TIMER

tIP

Time Interval Period

1650 selectable

Time Intervals

Minimum time

interval

100

ms

Maximum time

interval

7200

s

Time Interval Setting Accuracy(5)

Excluding the precision of Rext

±0.6%

Timer Interval Setting Accuracy over

supply voltage

1.8 V

≤ VDD ≤ 5.5 V

±25

ppm/V

tOSC

Oscillator Accuracy

–0.5%

0.5%

Oscillator Accuracy over

temperature(6)

–40°C

≤ TA ≤ 105°C

±100

±400 ppm/°C

Oscillator Accuracy over supply

voltage

1.8 V

≤ VDD ≤ 5.5 V

±0.4

%/V

Oscillator Accuracy over life time(7)

0.24%

tDONE

DONE Pulse width (6)

100

ns

tRSTn

RSTn Pulse width

320

ms

tWAKE

WAKE Pulse width

20

ms

t_Rext

Time to convert Rext

100

120

ms

DIGITAL LOGIC LEVELS

VIH

Logic High Threshold DONE pin

0.7 × VDD

V

VIL

Logic Low Threshold DONE pin

0.3 ×

VDD

V

VOH

Logic output High Level WAKE pin

Iout = 100 µA

VDD – 0.3

V

Iout = 1 mA

VDD – 0.7

V

VOL

Logic output Low Level WAKE pin

Iout = -100 µA

0.3

V

Iout = –1 mA

0.7

V

VOLRSTn

RSTn Logic output Low Level

IOL = –1 mA

0.3

V

IOHRSTn

RSTn High Level output current

VOHRSTn = VDD

1

nA

VIHM_RST

Logic High Threshold

DELAY/M_RST pin

1.5

V