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TPS2811 Datasheet(PDF) 12 Page - Texas Instruments |
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TPS2811 Datasheet(HTML) 12 Page - Texas Instruments |
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12 / 32 page ![]() Regulator 50 Ω 1 2 3 4 8 7 6 5 1 nF Output 0.1 µF 4.7 µF + VCC TPS2811 Regulator 50 Ω 1 2 3 4 8 7 6 5 CL(2) CL(1) Output 1 0.1 µF 4.7 µF + VCC TPS2811 Output 2 TPS2811-Q1 SLVSAE0 – JUNE 2010 www.ti.com Matching and Paralleling Connections Figure 19 and Figure 20 show the delays for the rise and fall time of each channel. As can be seen on a 5-ns scale, there is very little difference between the two channels at no load. Figures 23 and 24 show the difference between the two channels for a 1-nF load on each output. There is a slight delay on the rising edge, but little or no delay on the falling edge. As an example of extreme overload, Figures 25 and 26 show the difference between the two channels, or two drivers in the package, each driving a 10-nF load. As would be expected, the rise and fall times are significantly slowed down. Figures 28 and 29 show the effect of paralleling the two channels and driving a 1-nF load. A noticeable improvement is evident in the rise and fall times of the output waveforms. Finally, Figures 30 and 31 show the two drivers being paralleled to drive the 10-nF load and as could be expected the waveforms are improved. In summary, the paralleling of the two drivers in a package enhances the capability of the drivers to handle a larger load. Because of manufacturing tolerances, it is not recommended to parallel drivers that are not in the same package. Figure 19. Test Circuit for Measuring Switching Characteristics A. Input rise and fall times should be ≤10 ns for accurate measurement of ac parameters. Figure 20. Test Circuit for Measuring Switching Characteristics With the Inputs Connected in Parallel 12 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TPS2811-Q1 |
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