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L9965TS Datasheet(PDF) 46 Page - STMicroelectronics |
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L9965TS Datasheet(HTML) 46 Page - STMicroelectronics |
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46 / 62 page  Table 45. WKP pin truth table WKP_DIS WKP_SET WKP pin status 0 X 1 1 0 0 1 1 1 WKP pin should be used to drive the wake-up terminal of the system’s power management device. It should not be used as a switch for power management supply itself. This terminal is not reverse battery protected and thus should not be connected outside of the system module. 5.9.4 Diagnostic functions In NORMAL mode a short to GND/VIO detection is implemented to protect the pins output buffer through a coherency check between the driving signal and the pin value. In case of short to GND, the WKP pin is protected with thermal shutdown, see Section 5.4 for further details. Table 46. Interrupt pins diagnostic functions Fault type Assertion condition IC reaction to assertion Release condition IC reaction to release Maskable BNE short to GND or VIO BNE pin ≠ GEN_STATUS3.BNE in NORMAL • BNE_ERR = 1 in GEN_STATUS1 • The FLT pin and the SPI FAULT is asserted in NORMAL if MSK_BNE_ERR=0 in GEN_CFG3 • The output buffer is put in HiZ Clear on read • The driver is reengaged • BNE_ERR = 1 in status bit non maskable • FLT pin and SPI FAULT maskable by bit MSK_BNE_ERR in GEN_CFG3 FLT short to GND or VIO FLT pin ≠ SPI MISO frame bit 24 • FLT_ERR = 1 in GEN_STATUS1 • The SPI FAULT is asserted in NORMAL if MSK_FLT_ERR=0 in GEN_CFG3 • The output buffer is put in HiZ Clear on read • The driver is reengaged • FLT_ERR = 1 in status bit non maskable • SPI FAULT maskable by bit MSK_FLT_ERR in GEN_CFG3 WKP short to GND or VIO WKP pin ≠ GEN_STATUS3. WKP_STATUS in NORMAL • WKP_ERR = 1 in GEN_STATUS1 • The FLT pin and the SPI FAULT is asserted in NORMAL if MSK_WKP_ERR =0 in GEN_CFG3 • The output buffer is put in HiZ Clear on read • The driver is reengaged • WKP_ERR = 1 in status bit non maskable • FLT pin and SPI FAULT maskable by bit MSK_WKP_ERR in GEN_CFG3 5.9.5 Electrical parameters Table 47. Output buffer electrical characteristics Symbol PARAMETER TEST CONDITIONS MIN TYP MAX UNIT PIN VOUT_L Low output level I=2mA 0.4 V BNE FLT VOUT_H High output level I=-2mA VIO-0.4 V BNE FLT TOUT_trans Digital output Rise and Fall time. Cload=100pF 20-80% on rising edge, OUT 80-20% on falling edge 5 400 ns BNE FLT L9965T/L9965TS Functional description DS14987 - Rev 1 page 46/62 |
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