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DAC39RF10 Datasheet(PDF) 100 Page - Texas Instruments

Part # DAC39RF10
Description  DAC39RFx10-SP DAC39RFx10-SEP 10.4 or 20.8GSPS, 16-bit, Dual and Single Channel, Multi-Nyquist Digital-to-Analog Converter (DAC) with JESD204C Interface
PDF  232 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

DAC39RF10 Datasheet(HTML) 100 Page - Texas Instruments

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Table 7-3. Requirements for SYSREF period
Requirements on SYSREF Period
Reason
SYSREF period must be a multiple of 16 CLK cycles.
DAC Encoder/DEM always operates with a FDAC/16 clock that is
aligned to SYSREF.
SYSREF period must be a multiple of LT CLK cycles This constraint
does not apply to DDS mode (DDS_EN=1).
Makes sure the SYSREF period is a multiple of the input sample
period.
SYSREF period must be a multiple of 4*LT*S/F CLK cycles. This
constraint does not apply to DDS mode (DDS_EN=1).
Makes sure the SYSREF period is a multiple of the effective link
layer clock period.
SYSREF period must be a multiple of LT*S*K CLK cycles. This
constraint does not apply to Subclass 0 mode (SUBCLASS=0) or
DDS mode (DDS_EN=1)
Makes sure that SYSREF period is a multiple of the LMFC/LEMC
period. Note that K=256*E/F in 64b/66b mode.
7.3.5.2 SYSREF Position Detector and Sampling Position Selection (SYSREF Windowing)
The SYSREF Windowing block is used to first detect the position of SYSREF relative to the input clock
CLK± rising edge. Based on the window information, an optimum SYSREF sampling time is selected to
maximize setup and hold timing margins relative to the input clock. In many cases, a single SYSREF sampling
position SYSREF_SEL is sufficient to meet timing for all systems (device-to-device variation) and conditions
(temperature and voltage variations). However, this feature can also be used by the system to expand the timing
window by tracking the movement of SYSREF as operating conditions change or to remove system-to-system
variation at production test by finding a unique optimal value at nominal conditions for each system.
This section describes proper usage of the SYSREF Windowing block (SYSREF_RECV_SLEEP must be
programmed to 0). First, apply the device clock and SYSREF to the device. The location of SYSREF relative
to the device clock cycle is determined and stored in the SYSREF_POS field. Each bit of SYSREF_POS
represents a potential SYSREF sampling position. If a bit in SYSREF_POS is set to 1, then the corresponding
SYSREF sampling position has a potential setup or hold violation. Upon determining the valid SYSREF sampling
positions (the positions of SYSREF_POS that are set to 0) the desired sampling position can be chosen
by setting SYSREF_SEL to the value corresponding to that SYSREF_POS position. In general, the middle
sampling position between two setup and hold instances is chosen. The determination of SYSREF_SEL is
performed at the nominal operating conditions of the system (temperature and supply voltage) to provide
maximum margin for operating condition variations. This process can be performed at final test and the optimal
SYSREF_SEL setting can be stored for use at every system power up. Further, SYSREF_POS can be used to
characterize the skew between CLK± and SYSREF± over operating conditions for a system by sweeping the
system temperature and supply voltages. For systems that have large variations in CLK± to SYSREF± skew,
this characterization can be used to track the optimal SYSREF sampling position as system operating conditions
change. In general, a single value can be found that meets timing over all conditions for well-matched systems,
such as those where CLK± and SYSREF± come from a single clocking device.
The step size between each SYSREF_POS sampling position can be adjusted using SYSREF_ZOOM. When
SYSREF_ZOOM is set to 0, the delay steps are coarser. When SYSREF_ZOOM is set to 1, the delay steps
are finer. See the electrical specifications table for delay step sizes when SYSREF_ZOOM is enabled and
disabled. In general, SYSREF_ZOOM is recommended to always be used (SYSREF_ZOOM = 1) unless a
transition region (defined by 1's in SYSREF_POS) is not observed, which can be the case for low clock rates.
Bits 0 and 19 of SYSREF_POS are always 1 because there is insufficient information to determine if these
settings are close to a timing violation, although the actual valid window can extend beyond these sampling
positions. The value programmed into SYSREF_SEL is the decimal number representing the desired bit
location in SYSREF_POS. Table 7-4 lists some example SYSREF_POS readings and the optimal SYSREF_SEL
settings. Although 20 sampling positions are provided by the SYSREF_POS status register, SYSREF_SEL only
allows selection of the first 16 sampling positions, corresponding to SYSREF_POSbits 0 to 15. The additional
SYSREF_POS status bits are intended only to provide additional knowledge of the SYSREF valid window. In
general, lower values of SYSREF_SEL are selected because of delay variation over supply voltage, however in
the fourth example a value of 14 provides additional margin and can be selected instead.
If SYSREF_PS_EN is set to 0, only the last SYSREF edge is used for the SYSREF_POS values.
Setting SYSREF_PS_EN to 1 enables an "infinite persistence" mode, where if any SYSREF edge since
DAC39RF10-SP, DAC39RF10-SEP
DAC39RFS10-SP, DAC39RFS10-SEP
SBAS932A – MARCH 2024 – REVISED FEBRUARY 2026
www.ti.com
100
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Copyright © 2026 Texas Instruments Incorporated
Product Folder Links: DAC39RF10-SP DAC39RF10-SEP DAC39RFS10-SP DAC39RFS10-SEP



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