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ELECTRICAL CHARACTERISTICS

AMC1203

SBAS427 – FEBRUARY 2008

OSR = 256, unless otherwise noted.

AMC1203

PARAMETER

TEST CONDITIONS

MIN

MAX

UNIT

RESOLUTION

16

Bits

DC ACCURACY

AMC1203

±3

±9

LSB

INL

AMC1203B

±2

±6

LSB

DNL

–1

+1

LSB

–1

±0.1

1

mV

Offset error thermal drift

±1.5

±5

µV/°C

AMC1203

–2

±0.2

2

%

Gain error

AMC1203B

–1

±0.2

1

%

Gain error thermal drift

±20

ppm/

°C

PSRR

Power-supply rejection ratio

80

dB

ANALOG INPUTS

FSR

Full-scale differential voltage input range

–320

320

mV

–0.1

5

V

Input capacitance to GND1

3

pF

Differential input capacitance

6

pF

Differential input resistance

28

k

Ω

Input leakage current

–5

5

nA

CMTI

Common-mode transient immunity

15

kV/

µs

92

dB

CMRR

Common-mode rejection ratio

105

dB

INTERNAL CLOCK

Clock period

See Figure 2

83.33

100

125

ns

Clock frequency

See Figure 2

8

10

12

MHz

Clock high-time

See Figure 2

50

ns

Data valid time after falling edge of clock

See Figure 2

–2

0

2

ns

AC ACCURACY

SINAD

Signal-to-noise + distortion

80

85

dB

SNR

Signal-to-noise ratio

80.5

85

dB

–92

–84.5

dB

THD

Total harmonic distortion

–95

–88

86

92

dB

SFDR

Spurious-free dynamic range

89

95

(1)

(2)

Integral nonlinearity is defined as the maximum deviation of the line through the inputs of the specified input range of the transfer curve

of the specified VIN expressed either as number of LSBs, or as a percent of the specified 560mV input range.

(3)

Ensured by design.

(4)

Maximum values, including temperature drift, are ensured over the full specified temperature range.

Copyright © 2008, Texas Instruments Incorporated

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