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LMX1602 Datasheet(PDF) 14 Page - National Semiconductor (TI) |
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LMX1602 Datasheet(HTML) 14 Page - National Semiconductor (TI) |
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14 / 17 page ![]() 2.0 Programming Description (Continued) 2.6 SERIAL DATA INPUT TIMING 10012919 Note 17: Data shifted into register on clock rising edge. Data is shifted in MSB first. TEST CONDITIONS: The Serial Data Input Timing is tested using a symmetrical waveform around V CC/2. The test waveform has an edge rate of 0.6 V/ns with amplitudes of 2.2V @ V CC = 2.7V. www.national.com 14 |
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