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TC213 Datasheet(PDF) 2 Page - Texas Instruments

Part # TC213
Description  1024-512-pixel ccd image sensor
PDF  21 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

TC213 Datasheet(HTML) 2 Page - Texas Instruments

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TC213
1024-
× 512-PIXEL CCD IMAGE SENSOR
SOCS013B – AUGUST 1989 – REVISED DECEMBER 1991
2-2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
Gated floating-diffusion detection structures are used with each serial register to convert charge to signal
voltage. External resets allow the application of off-chip correlated clamp sample-and-hold amplifiers for
low-noise performance. To provide high output-drive capability, both outputs are buffered by low-noise,
two-stage, source-follower amplifiers. These two output signals can provide a data rate of 20 megapixels per
second when combined off chip. An output of 30 frames per second with one field per frame is typical. At room
temperature, the readout noise is 55 elecrons and a minimum dynamic range of 60 dB is available.
The blooming protection incorporated into the sensor is based on recombining excess charge with charge of
opposite polarity in the substrate. This antiblooming is activated by supplying clocking pulses to the
antiblooming gate, which is an integral part of each image-sensing element. The storage area antiblooming gate
is clocked only for charge transfer in normal use.
The TC213 is built using TI-proprietary virtual-phase technology, which provides devices with high blue
response, low dark signal, good uniformity, and single-phase clocking.
The TC213 is characterized for operation from –10
°C to 40°C.
functional block diagram
24 Dark Reference Elements
Clearing Drain
Amplifiers
OUT1
OUT2
RST2
IAG
TDB
19
21
6
3
1
2
AMP GND
CDB
8
SRG2
SRG1
TRG
IDB
11
9
10
ABGS
13
SAG
ABGI
14
15
Blooming Protection
Image Area With
Top Drain
12 Dummy
Elements
Multiplexer, Transfer Gates,
and Serial Registers
12
IAG
16
ADB
4
ABGI
22
RST1
7
SAG
23
ABGS
24
Storage Area



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