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AM1808AZCED3 Datasheet(PDF) 252 Page - Texas Instruments |
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AM1808AZCED3 Datasheet(HTML) 252 Page - Texas Instruments |
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252 / 264 page ![]() AM1808 SPRS653A – FEBRUARY 2010 – REVISED APRIL 2010 www.ti.com Table 6-143. ARM Debug Features Category Hardware Feature Availability Software breakpoint Unlimited Up to 14 HWBPs, including: 2 precise(1) HWBP inside ARM core which are shared with watch points. Basic Debug Hardware breakpoint 8 imprecise(1) HWBPs from ETM’s address comparators, which are shared with trace function, and can be used as watch points. 4 imprecise(1) HWBPs from ICECrusher. Up to 6 watch points, including: 2 from ARM core which is shared with HWBPs and can be associated with a data. Watch point 8 from ETM’s address comparators, which are shared with trace function, and HWBPs. 2 from ARM core which is shared with HWBPs. Analysis Watch point with Data 8 watch points from ETM can be associated with a data comparator, and ETM has total 4 data comparators. Counters/timers 3x32-bit (1 cycle ; 2 event) External Event Trigger In 1 External Event Trigger Out 1 Address range for trace 4 Data qualification for trace 2 System events for trace control 20 Trace Control Counters/Timers for trace control 2x16-bit State Machines/Sequencers 1x3-State State Machine Context/Thread ID Comparator 1 Independent trigger control units 12 Capture depth PC 4k bytes ETB On-chip Trace Capture depth PC + Timing 4k bytes ETB Capture Application accessible Y (1) Precise hardware breakpoints will halt the processor immediately prior to the execution of the selected instruction. Imprecise breakpoints will halt the processor some number of cycles after the selected instruction depending on device conditions. 6.34.1 JTAG Port Description The device target debug interface uses the five standard IEEE 1149.1(JTAG) signals (TRST, TCK, TMS, TDI, and TDO), a return clock (RTCK) due to the clocking requirements of the ARM926EJ-S and emulation signals EMU0 and EMU1. TRST holds the debug and boundary scan logic in reset when pulled low (its default state). Since TRST has an internal pull-down resistor, this ensures that at power up the device functions in its normal (non-test) operation mode if TRST is not connected. Otherwise, TRST should be driven inactive by the emulator or boundary scan controller. Boundary scan test cannot be performed while the TRST pin is pulled low. Table 6-144. JTAG Port Description PIN TYPE NAME DESCRIPTION When asserted (active low) causes all test and debug logic in the device to be reset TRST I Test Logic Reset along with the IEEE 1149.1 interface This is the test clock used to drive an IEEE 1149.1 TAP state machine and logic. TCK I Test Clock Depending on the emulator attached to , this is a free running clock or a gated clock depending on RTCK monitoring. Synchronized TCK. Depending on the emulator attached to, the JTAG signals are RTCK O Returned Test Clock clocked from RTCK or RTCK is monitored by the emulator to gate TCK. TMS I Test Mode Select Directs the next state of the IEEE 1149.1 test access port state machine TDI I Test Data Input Scan data input to the device TDO O Test Data Output Scan data output of the device 252 Peripheral Information and Electrical Specifications Copyright © 2010, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Link(s): AM1808 |
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