Symbol

Parameter

Conditions

Min

(Note 5)

Typ

(Note 5)

Max

(Note 5)

Units

I

BI

Input Bias Current

(Note 6)

−15

−23

−35

μA

I

OS

Input Offset Current

±0.13

±1.8

±3.0

μA

T

Input offset voltage

temperature drift

(Note 7)

±3.2

nA/°C

C

CM

Input Capacitance

Common Mode

1.7

pF

R

CM

Input Resistance

Common Mode

1

M

Ω

MISCELLANEOUS PARAMETERS

CMRR

Common Mode Rejection

Ratio

V

84

81

87

dB

PSRR

Power supply rejection ratio

82

79

84

A

VOL

Open Loop Gain

78

73

79

DIGITAL INPUTS/TIMING

V

IL

Logic low-voltage threshold

PD and COMP pins

0.8

V

V

IH

Logic high-voltage threshold

2.0

I

IL

Logic low-bias current

PD and COMP pins = 0.8V (Note 6)

-17

−14

−23

−28

−32

µA

I

IH

Logic high-bias current

PD and COMP pins = 2.0V (Note 6)

−16

−13

−22

−27

−31

T

en

Enable time

75

ns

T

dis

Disable time

80

POWER REQUIREMENTS

I

S

Supply Current

No Load, Normal Operation (PD Pin =

HI or open)

13.7

14.9

16.0

mA

No Load, Shutdown (PD Pin = LO)

0.89

1.4

1.5

Note 1: Absolute maximum ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is

intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics.

Note 2: Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating

of the device such that T

T

Note 3: The maximum continuous output current (I

ambient temperature can result in exceeding the maximum allowed junction temperature of 150°C

Note 4: Human Body Model, applicable std. JESD22-A114C. Machine Model, applicable std. JESD22-A115-A. Field Induced Charge Device Model, applicable

std. JESD22-C101-C.

Note 5: Typical numbers are the most likely parametric norm. Bold numbers refer to over-temperature limits.

Note 6: Negative input current implies current flowing out of the device.

Note 7: Drift determined by dividing the change in parameter at temperature extremes by the total temperature change.

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