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AD5755 Datasheet(PDF) 11 Page - Analog Devices

Part # AD5755
Description  Quad Channel, 16-Bit, Serial Input, 4-20mA & Voltage Output DAC, Dynamic Power Control
PDF  34 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

AD5755 Datasheet(HTML) 11 Page - Analog Devices

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Preliminary Technical Data
AD5755/AD5735
Rev. PrG | Page 11 of 34
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted. Transient currents of up to
100 mA do not cause SCR latch-up.
Table 5.
Parameter
Rating
AVDD to AGND, DGND
−0.3 V to +33 V
AVSS to AGND, DGND
+0.3 V to −28 V
AVDD to AVSS
−0.3 V to +60 V
AVcc to AGND
−0.3 V to +7 V
DVDD to DGND
−0.3 V to +7 V
Digital Inputs to DGND
−0.3 V to DVDD + 0.3 V or
+7 V (whichever is less)
Digital Outputs to DGND
−0.3 V to DVDD + 0.3 V
REFIN/REFOUT to AGND
−0.3 V to AVDD + 0.3 V or +7
V (whichever is less)
VOUT A,B,C,D to AGND
AVSS to VBOOST or 33V if using
the DC-DC circuitry.
−VSENSEA,B,C,D / +VSENSEA,B,C,D to AGND
AVSS to VBOOST or 33V if using
the DC-DC circuitry.
COMPLVA,B,C,D to AGND
0.3 V to +5 V
IOUT A,B,C,D to AGND
AVSS to VBOOST or 33V if using
the DC-DC circuitry.
RSETA,B,C,D to AGND
−0.3 V to AVDD + 0.3 V or +7
V (whichever is less)
SWA,B,C,D / VBOOSTA,B,C,D to AGND
−0.3 to +33 V
COMPDCDC_A,B,C,D to AGND
−0.3 V to +5 V
AGND, GNDSWA,B,C,D to DGND
−0.3 V to +0.3 V
Operating Temperature Range (TA)
Industrial1
−40°C to +105°C
Storage Temperature Range
−65°C to +150°C
Junction Temperature (TJ max)
125°C
64-Lead LFCSP
θJA Thermal Impedance2
20°C/W
Power Dissipation
(TJmax – TA)/θJA
Lead Temperature
JEDEC Industry Standard
Soldering
J-STD-020
1 Power dissipated on chip must be derated to keep the junction temperature
below 125°C
2 Based on a JEDEC 4 layer test board
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION



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