PCF8523 datasheet(47/66 Pages) NXP

47 / 66 page

PCF8523

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Product data sheet

Rev. 3 — 30 March 2011

47 of 66

NXP Semiconductors

PCF8523

Real-Time Clock (RTC) and calendar

10. Limiting values

[1]

Pass level; Human Body Model (HBM), according to Ref. 6 “JESD22-A114”.

[2]

Pass level; Charged-Device Model (CDM), according to Ref. 7 “JESD22-C101”.

[3]

Pass level; latch-up testing according to Ref. 8 “JESD78” at maximum ambient temperature (Tamb(max)).

[4]

According to the NXP store and transport requirements (see Ref. 10 “NX3-00092”) the devices have to be

stored at a temperature of +8

C to +45 C and a humidity of 25 % to 75 %. For long-term storage products,

deviant conditions are described in that document.

Table 45.

Limiting values

In accordance with the Absolute Maximum Rating System (IEC 60134).

Symbol

Parameter

Conditions

Min

Max

Unit

VDD

supply voltage

0.5

+6.5

IDD

supply current

50

+50

input voltage

0.5

+6.5

output voltage

0.5

+6.5

input current

10

+10

output current

10

+10

VBAT

battery supply voltage

0.5

+6.5

Ptot

total power dissipation

300

VESD

electrostatic discharge voltage

HBM

[1] -

2000 V

CDM

[2] -

1500 V

Ilu

latch-up current

[3] -100

Tstg

storage temperature

[4]

65

+150

C

Tamb

ambient temperature

operating device

40

+85

C

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