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AD9628 Datasheet(PDF) 32 Page - Analog Devices |
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AD9628 Datasheet(HTML) 32 Page - Analog Devices |
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32 / 44 page ![]() AD9628 Rev. 0 | Page 32 of 44 BUILT-IN SELF-TEST (BIST) AND OUTPUT TEST The AD9628 includes a built-in test feature designed to enable verification of the integrity of each channel, as well as to facilitate board level debugging. A built-in self-test (BIST) feature that verifies the integrity of the digital datapath of the AD9628 is included. Various output test options are also provided to place predictable values on the outputs of the AD9628. BUILT-IN SELF-TEST (BIST) The BIST is a thorough test of the digital portion of the selected AD9628 signal path. Perform the BIST test after a reset to ensure that the part is in a known state. During BIST, data from an internal pseudorandom noise (PN) source is driven through the digital datapath of both channels, starting at the ADC block output. At the datapath output, CRC logic calculates a signature from the data. The BIST sequence runs for 512 cycles and then stops. Once completed, the BIST compares the signature results with a predetermined value. If the signatures match, the BIST sets Bit 0 of Register 0x24, signifying the test passed. If the BIST test fails, Bit 0 of Register 0x24 is cleared. The outputs are connected during this test, so the PN sequence can be observed as it runs. Writing the value 0x05 to Register 0x0E runs the BIST. This enables Bit 0 (BIST enable) of Register 0x0E and resets the PN sequence generator, Bit 2 (initialize BIST sequence) of Register 0x0E. At the completion of the BIST, Bit 0 of Register 0x24 is automatically cleared. The PN sequence can be continued from its last value by writing a 0 in Bit 2 of Register 0x0E. However, if the PN sequence is not reset, the signature calculation does not equal the predetermined value at the end of the test. At that point, the user must rely on verifying the output data. OUTPUT TEST MODES The output test options are described in Table 18 at Address 0x0D. When an output test mode is enabled, the analog section of the ADC is disconnected from the digital back-end blocks and the test pattern is run through the output formatting block. Some of the test patterns are subject to output formatting, and some are not. The PN generators from the PN sequence tests can be reset by setting Bit 4 or Bit 5 of Register 0x0D. These tests can be performed with or without an analog signal (if present, the analog signal is ignored), but they do require an encode clock. For more information, see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI. |
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