CDCM9102 datasheet(5/22 Pages) TI

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CDCM9102

www.ti.com

SCAS922

– FEBRUARY 2012

CRYSTAL-OSCILLATOR INPUT-PORT CHARACTERISTICS (XIN)

VDD = 3.3 V, TA = –40°C to 85°C

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

CRYSTAL CHARACTERISTICS (External 25 MHz Crystal)

fXTAL

Crystal input frequency

Fundamental mode

MHz

ESR

Effective series resistance of crystal

CIN

On-chip load capacitance

XTALDL

Maximum drive level - XTAL

0.1

CSHUNT

Maximum shunt capacitance

CLOCK OUTPUT BUFFER CHARACTERISTICS (OUTPUT MODE = LVPECL)

VDD1, VDD2 = 3.3 V; TA = –40°C to 85°C

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VOH

Output high voltage

VDD – 1.18

VDD – 0.73

VOL

Output low voltage

VDD – 2

VDD – 1.55

|VOD|

Differential output voltage

0.6

1.23

tR/tF

Output rise/fall time

20% to 80%

175

ODC

Output duty cycle

45%

55%

tSKEW

Skew between outputs

CLOCK OUTPUT BUFFER CHARACTERISTICS (OUTPUT MODE = LVDS)

VDD1, VDD2 = 3.3V; TA = –40°C to 85°C

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

|VOD|

Differential output voltage

0.247

0.454

ΔVOD

VOD magnitude change

VOS

Common-mode voltage

1.125

1.375

ΔVOS

VOS magnitude change

tR/tF

Output rise/fall time

20% to 80%

255

ODC

Output duty cycle

45%

55%

tSKEW

Skew between outputs

CLOCK OUTPUT BUFFER CHARACTERISTICS (OUTPUT MODE = LVCMOS)

VDD1, VDD2 = 3.3V; TA = –40°C to 85°C

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VOH

Output high voltage

VCC = 3 V to 3.6 V, IOH = –100 µA

VDD – 0.5

VOL

Output low voltage

VCC = 3 V to 3.6 V, IOH = 100 µA

0.3

tSLEW

Output rise/fall slew rate

20% to 80%

2.4

V/ns

ODC

Output duty cycle

45%

55%

tSKEW

Skew between outputs

OUTPUT JITTER PERFORMANCE

fOUT = 100 MHz, VDD = 3.3 V, TA = 25°C, jitter integration bandwidth 10 kHz–20 MHz

LVCMOS OUTPUT MODE

LVPECL OUTPUT MODE

LVDS OUTPUT MODE

Random jitter

Period jitter

Random jitter

Period jitter

Random jitter

Period jitter

(fs)

(ps pk-pk)

(fs)

(ps pk-pk)

(fs)

(ps pk-pk)

507

24.5

510

20.7

533

26.5

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