OPA365-EP

SLOS735

– AUGUST 2011

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PACKAGE

ORDERABLE PART NUMBER

TOP-SIDE MARKING

–55°C to 125°C

SOT23

– DBV

OPA365AMDBVTEP

OUNM

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

Supply voltage

5.5 V

(V

−) − 0.5V to (V+) + 0.5 V

±10 mA

Continuous

Operating temperature

−55°C to 125°C

Storage temperature

−65°C to 150°C

Junction temperature

150

°C

Human Body Model

4000V

ESD

Electrostatic discharge rating

Charged Device Model

1000V

Machine Model

200V

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5V beyond the supply rails should

be current limited to 10mA or less.

(3)

Short-circuit to ground, one amplifier per package

(4)

Continuous output current greater than 20 mA for extended periods may affect product reliability.

2

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© 2011, Texas Instruments Incorporated

Product Folder Link(s): OPA365-EP