IMX51 datasheet(72/202 Pages) FREESCALE

72 / 202 page

i.MX51 Applications Processors for Consumer and Industrial Products, Rev. 6

Freescale Semiconductor

Electrical Characteristics

NOTE

Measurements are taken from Vref to Vref (cross-point to cross-point), but

JEDEC timings for single-ended signals are defined from Vref to Vil(ac)

max or to Vih(ac) min.

Table 61. Derating values for DDR2 Differential DQS1,2

Table 62. Derating values for DDR2 Single Ended DQS3,4

1. Test conditions are: Capacitance 15 pF for DDR PADS. Recommended drive strengths is medium for SDCLK and high for

address and controls.

2. SDRAM CLK and DQS related parameters are being measured from the 50% point. that is, high is defined as 50% of signal

value and low is defined as 50% as signal value. DDR SDRAM CLK parameters are measured at the crossing point of SDCLK

and SDCLK (inverted clock).

3. Test conditions are: Capacitance 15 pF for DDR PADS. Recommended drive strengths is medium for SDCLK and high for

address and controls.

4. SDRAM CLK and DQS related parameters are being measured from the 50% point. that is, high is defined as 50% of signal

value and low is defined as 50% as signal value. DDR SDRAM CLK parameters are measured at the crossing point of SDCLK

and SDCLK (inverted clock).

IMX51 Datasheet(PDF) 72 Page - Freescale Semiconductor, Inc