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MA17501 Datasheet(PDF) 27 Page - Dynex Semiconductor |
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MA17501 Datasheet(HTML) 27 Page - Dynex Semiconductor |
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27 / 35 page ![]() MA17501 27/35 Table 5: Absolute Maximum Ratings 6.0 ABSOLUTE MAXIMUM RATINGS Parameter Min Max Units Supply Voltage -0.5 7 V Input Voltage -0.3 VDD+0.3 V Current Through Any Pin -20 +20 mA Operating Temperature -55 125 °C Storage Temperature -65 150 °C Note: Stresses above those listed may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these conditions, or at any other condition above those indicated in the operations section of this specification, is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Total Dose Radiation Not Exceeding 3x10 5 Rad(Si) Symbol Parameter Conditions Min Typ Max Units VDD Supply Voltage VSS = 0 4.5 5.0 5.5 V VIHC CMOS Input High Voltage (Note 1) - VDD-1 - - V VILC CMOS Input Low Voltage (Note 1) - - - VSS+1 V VIHT TTL Input High Voltage (Note 2) - 2.0 - - V VILT TTL Input Low Voltage (Note 2) - - - 0.8 V VCH OSC Input High Voltage (Note 6) - 4.0 - - V VCL OSC Input Low Voltage (Note 6) - - - 1.0 V VOHC CMOS Output High Voltage (Note 1) IOH = -1.4mA, VDD = 4.5V 4.0 - - V VOLC CMOS Output Low Voltage (Note 1) IOL = 2mA, VDD = 5.5V - - 0.5 V VOHT TTL Output High Voltage (Note 2) IOH = -1.4mA, VDD = 4.5V 3.5 - - V VOLT TTL Output Low Voltage (Note 2) IOH = -1.4mA, VDD = 4.5V - - 0.4 V VOHCLK Clock Output High Voltage (Note 3) IOH = -12mA, VDD = 4.5V 4.0 - - V VOLCLK Clock Output Low Voltage (Note 3) IOL = 12mA, VDD = 5.5V - - 0.5 V II Input Leakage Current (Note 4) VDD = 5.5V, VIN = 0V or 5.5V - - ±10 µA IOZ Output Leakage Current (Note 4) VDD = 5.5V, VO = 0V or 5.5V - - ±50 µA IIPU TESTN Input Pullup Current (Note 5) VDD = 5.5V, TESTN = 0V - -150 -300 µA IDDOP Operating Supply Current VDD = 5.5V, OSC = 20MHz - 25 35 mA IDDST Static Supply Current VDD = 5.5V, OSC = 0MHz - 5 10 mA Mil-Std-883, Method 5005, Subgroup 1, 2, 3. Notes: 1. The following signals are CMOS compatible: a) CMOS inputs: Microcode Bus, (M00-M19), TESTN, IRDYN and PIFN. b) CMOS outputs: T1, OVIN, INTREN, SYSCLK1N, CLKPCN and CLK02N. 2. The following signals are TTL compatible: a) TTL inputs: HOLDN, RESET, PAUSEN, RDYN and OSC. b) TTL outputs: HOLDAKN and SYNCN. c) TTL 3 state outputs: AS, DSN, M/ION, RD/WN and IN/OPN. d) TTL 3 state I/O signals: Address/Data Bus (AD00-AD15). 3. The clock output pins, SYSCLK1N, SYNCLK, CLKPCN and CLK02N have a higher drive capability than the standard outputs. 4. Worst case at TA = +125°C, guaranteed but not tested at TA = -55°C. 5. The TESTN input signal is used during chip test and has an integral pullup reistor. In normal operation TESTN is at VDD. 6. Guaranteed but not tested. 7.0 DC ELECTRICAL CHARACTERISTICS Table 6: Operating DC Electrical Characteristics |
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