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ADP3650 Datasheet(PDF) 3 Page - Analog Devices

Part # ADP3650
Description  Dual, Bootstrapped, 12 V MOSFET Driver with Output Disable
PDF  12 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADP3650 Datasheet(HTML) 3 Page - Analog Devices

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ADP3650
Rev. A | Page 3 of 12
SPECIFICATIONS
VCC = 12 V, BST = 4 V to 26 V, TA = −40°C to +85°C, unless otherwise noted.1
Table 1.
Parameter
Symbol
Test Conditions/Comments
Min
Typ
Max
Unit
DIGITAL INPUTS (IN, OD)
Input Voltage High
2.0
V
Input Voltage Low
0.8
V
Input Current
−1
+1
μA
Hysteresis
40
250
350
mV
HIGH-SIDE DRIVER
Output Resistance, Sourcing Current
BST − SW = 12 V; TA = 25°C
3.3
Ω
BST − SW = 12 V; TA = −40°C to +85°C
2.5
3.9
Ω
Output Resistance, Sinking Current
BST − SW = 12 V; TA = 25°C
1.8
Ω
BST − SW = 12 V; TA = −40°C to +85°C
1.4
2.6
Ω
Output Resistance, Unbiased
BST − SW = 0 V
10
Transition Times
trDRVH
BST − SW = 12 V, CLOAD = 3 nF, see Figure 3
25
40
ns
tfDRVH
BST − SW = 12 V, CLOAD = 3 nF, see Figure 3
20
30
ns
Propagation Delay Times
tpdhDRVH
BST − SW = 12 V, CLOAD = 3 nF,
32
45
70
ns
25°C ≤ TA ≤ 85°C, see Figure 3
tpdlDRVH
BST − SW = 12 V, CLOAD = 3 nF, see Figure 3
25
35
ns
OD
pdl
t
See Figure 2
20
35
ns
OD
pdh
t
See Figure 2
40
55
ns
SW Pull-Down Resistance
SW to PGND
10
LOW-SIDE DRIVER
Output Resistance, Sourcing Current
TA = 25°C
3.3
Ω
TA = −40°C to +85°C
2.4
3.9
Ω
Output Resistance, Sinking Current
TA = 25°C
1.8
Ω
TA = −40°C to +85°C
1.4
2.6
Ω
Output Resistance, Unbiased
VCC = PGND
10
Transition Times
trDRVL
CLOAD = 3 nF, see Figure 3
20
35
ns
tfDRVL
CLOAD = 3 nF, see Figure 3
16
30
ns
Propagation Delay Times
tpdhDRVL
CLOAD = 3 nF, see Figure 3
12
35
ns
tpdlDRVL
CLOAD = 3 nF, see Figure 3
30
45
ns
OD
pdl
t
See Figure 2
20
35
ns
OD
pdh
t
See Figure 2
110
190
ns
Timeout Delay
SW = 5 V
110
190
ns
SW = PGND
95
150
ns
SUPPLY
Supply Voltage Range
VCC
4.15
13.2
V
Supply Current
ISYS
BST = 12 V, IN = 0 V
2
5
mA
UVLO Voltage
VCC rising
1.5
3.0
V
Hysteresis
350
mV
1 All limits at temperature extremes are guaranteed via correlation using standard statistical quality control (SQC) methods.



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