28F010 datasheet(20/30 Pages) INTEL

20 / 30 page

28F010

AC TESTING INPUTOUTPUT

WAVEFORM(1)

290207 – 7

AC test inputs are driven at VOH (24 VTTL) for a Logic

‘‘1’’ and VOL (045 VTTL) for a Logic ‘‘0’’ Input timing

begins at VIH (20 VTTL) and VIL (08 VTTL) Output tim-

ing ends at VIH and VIL Input rise and fall times (10%

to 90%) k10 ns

HIGH SPEED AC TESTING INPUTOUTPUT

WAVEFORM(2)

290207 – 8

AC test inputs are driven at 30V for a Logic ‘‘1’’ and

00V for a Logic ‘‘0’’ Input timing begins and output

timing ends at 15V Input rise and fall times (10% to

90%) k10 ns

AC TESTING LOAD CIRCUIT(1)

CL e 100 pF

CL includes Jig Capacitance

290207 – 22

RL e 33 KX

HIGH SPEED AC TESTING LOAD CIRCUIT(2)

CL e 30 pF

CL includes Jig Capacitance

290207 – 23

RL e 33 KX

AC TEST CONDITIONS(1)

Input Rise and Fall Times (10% to 90%)

10 ns

Input Pulse Levels

045V and 24V

Input Timing Reference Level

08V and 20V

Output Timing Reference Level

08V and 20V

Capacitive Load

100 pF

HIGH-SPEED AC TEST CONDITIONS(2)

Input Rise and Fall Times (10% to 90%)

10 ns

Input Pulse Levels

00V and 30V

Input Timing Reference Level

15V

Output Timing Reference Level

15V

Capacitive Load

30 pF

NOTES

1 Testing characteristics for 28F010-65 in standard configuration and 28F010-90 28F010-120 and 28F010-150

2 Testing characteristics for 28F010-65 in high speed configuration

28F010 Datasheet(PDF) 20 Page - Intel Corporation

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