28F020 datasheet(27/38 Pages) INTEL

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28F020

Output

Test Points

Input

2.0

0.8

2.0

0.8

2.4

0.45

0245_06

AC test inputs are driven at VOH (2.4 VTTL) for a Logic “1”

and VOL (0.45 VTTL) for a Logic “0.” Input timing begins at

VIH (2.0 VTTL) and VIL (0.8 VTTL). Output timing ends at VIH

and VIL. Input rise and fall times (10% to 90%)

<10 ns.

Figure 6. Testing Input/Output Waveform(1)

Device

Under Test

Out

L = 3.3 kΩ

1N914

1.3V

L = 100 pF

0245_07

CL Includes Jig Capacitance

Figure 7. AC Testing Load Circuit(1)

Output

Test Points

Input

1.5

3.0

0.0

1.5

0245_08

AC test inputs are driven at 3.0 V for a Logic “1” and 0.0 V

for a Logic “0.” Input timing begins, and output timing ends,

at 1.5 V. Input rise and fall times (10% to 90%)

<10 ns.

Figure 8. High Speed AC Testing Input/Output

Waveforms(2)

Device

Under Test

Out

L = 3.3 kΩ

1N914

1.3V

L = 30 pF

0245_09

CL Includes Jig Capacitance

Figure 9. High Speed AC Testing Load Circuit(2)

NOTES:

Testing characteristics for 28F020-70 in standard configuration, and 28F020-90 and 28F020-150.

Testing characteristics for 28F020-70 in high speed configuration.

28F020 Datasheet(PDF) 27 Page - Intel Corporation

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