E

28F020

31

NOTES:

1.

Read timing characteristics during read/write operations are the same as during read-only operations. Refer to

AC

Characteristics for Read-Only Operations.

2.

Guaranteed by design.

3.

The integrated stop timer terminates the programming/erase operations, thus eliminating the need for a maximum

specification.

4.

See

High Speed AC Testing Input/Output Waveform (Figure 8) and High Speed AC Testing Load Circuit (Figure 9) for

testing characteristics.

5.

Minimum Specification for Extended Temperature product.

6.

See

Testing Input/Output Waveform (Figure 6) and AC Testing Load Circuit (Figure 7) for testing characteristics.

4.10

Erase and Programming Performance

Limits

Parameter

Notes

Min

Typ

Max

Unit

Chip-Erase Time

1, 3, 4

2

30

Sec

Chip-Program Time

1, 2, 4

4

25

Sec

NOTES:

1.

“Typicals” are not guaranteed, but based on a limited number of samples from production lots. Data taken at 25 °C, 12.0 V

2.

Minimum byte programming time excluding system overhead is 16 µsec (10 µsec program + 6 µsec write recovery), while

maximum is 400 µsec/byte (16 µsec x 25 loops allowed by algorithm). Max chip-programming time is specified lower than

the worst case allowed by the programming algorithm since most bytes program significantly faster than the worst case

byte.

3.

Excludes 00H programming prior to erasure.

4.

Excludes System-Level Overhead.