BATTERY PROTECTION IC FOR 1-CELL PACK

S-8211C Series

Seiko Instruments Inc.

14

3. 5

S-8211CAF, S-8211CAO, S-8211CAP, S-8211CAQ, S-8211CBD, S-8211CBJ, S-8211CBO, S-8211CCC,

S-8211CCF, S-8211CCI, S-8211CCS, S-8211CCU, S-8211CCX, S-8211CDE, S-8211CDF, S-8211CDH,

S-8211CDI, S-8211CDK, S-8211CDL

Table 15

Item

Symbol

Condition

Min.

Typ.

Max.

Unit

Test

Condition

Test

Circuit

Delay Time (Ta =

+25°C)

Overcharge detection delay time

−

0.96

1.2

1.4

s

9

5

Overdischarge detection delay time

−

30

38

46

ms

9

5

Discharge overcurrent detection delay time

−

7.2

9

11

ms

10

5

Load short-circuiting detection delay time

−

240

300

360

μs

10

5

Charge overcurrent detection delay time

−

7.2

9

11

ms

10

5

Delay Time (Ta =

−40°C to +85°C)

P

*1

Overcharge detection delay time

−

0.7

1.2

2.0

s

9

5

Overdischarge detection delay time

−

20

38

65

ms

9

5

Discharge overcurrent detection delay time

−

5

9

15

ms

10

5

Load short-circuiting detection delay time

−

150

300

540

μs

10

5

Charge overcurrent detection delay time

−

5

9

15

ms

10

5

*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed

by design, not tested in production.

3. 6 S-8211CAW, S-8211CDD

Table 16

Item

Symbol

Condition

Min.

Typ.

Max.

Unit

Test

Condition

Test

Circuit

Delay Time (Ta =

+25°C)

Overcharge detection delay time

−

0.96

1.2

1.4

s

9

5

Overdischarge detection delay time

−

120

150

180

ms

9

5

Discharge overcurrent detection delay time

−

3.6

4.5

5.4

ms

10

5

Load short-circuiting detection delay time

−

240

300

360

μs

10

5

Charge overcurrent detection delay time

−

7.2

9

11

ms

10

5

Delay Time (Ta =

−40°C to +85°C)

P

*1

Overcharge detection delay time

−

0.7

1.2

2.0

s

9

5

Overdischarge detection delay time

−

83

150

255

ms

9

5

Discharge overcurrent detection delay time

−

2.5

4.5

7.7

ms

10

5

Load short-circuiting detection delay time

−

150

300

540

μs

10

5

Charge overcurrent detection delay time

−

5

9

15

ms

10

5

*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed

by design, not tested in production.