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S8213 Datasheet(PDF) 12 Page - Seiko Instruments Inc |
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S8213 Datasheet(HTML) 12 Page - Seiko Instruments Inc |
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12 / 28 page ![]() BATTERY PROTECTION IC FOR 2-SERIAL / 3-SERIAL CELL PACK (SECONDARY PROTECTION) S-8213 Series Rev.1.3_01 Seiko Instruments Inc. 12 3. Test mode The overcharge detection delay time (tCU) can be shortened by entering the test mode. The test mode can be set by retaining the VDD pin voltage 4.0 V or more higher than the VC1 pin voltage for 20 ms or longer. The status is retained by the internal latch and the test mode is retained even if the VDD pin voltage is decreased to the same voltage as that of the VC1 pin voltage. After that, the latch for retaining the test mode is reset and the S-8213 Series exits from test mode under the overcharge status. VCUn Pin voltage CO pin (Active "H") Test mode VDD pin voltage 4.0 V or more Battery voltage VHCn tTST = 20 ms max. VC1 pin voltage (n = 1 to 3) 32 ms typ. CO pin (Active "L") 2.0 ms typ. Figure 11 |
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