BATTERY PROTECTION IC FOR 2-SERIES OR 3-SERIES-CELL PACK

S-8253C/D Series

Seiko Instruments Inc.

11



Test Circuits

1. Overcharge Detection Voltage 1, Overcharge Release Voltage 1, Overdischarge Detection Voltage 1,

Overdischarge Release Voltage 1

(Test Condition 1, Test Circuit 1)

Confirm that V1

= V2 = 3.5 V (S-8253C Series), V1 = V2 = V3 = 3.5 V (S-8253D Series), V4 = 0 V, V5 = 0 V, and the

× 0.1 V or lower) (this status is referred to as the initial status).

× 0.9 V or

more) after the V1 voltage has been gradually increased starting at the initial status. Overcharge release voltage

decreased.

voltage of V1 when the voltage at the DOP pin is low after the V1 voltage has been gradually increased.

By changing Vn (n

can be measured in the same way as when n

= 1.

2. Overcurrent Detection Voltage 1, Overcurrent Detection Voltage 2, Overcurrent Detection Voltage 3

(Test Condition 2, Test Circuit 1)

Confirm that V1

= V2 = 3.5 V (S-8253C Series), V1 = V2 = V3 = 3.5 V (S-8253D Series), V4 = 0 V, V5 = 0 V, and the

COP pin and DOP pin are low (this status is referred to as the initial status).

high after the V5 voltage has been gradually increased starting at the initial status.

(within 10

μs) from the initial state, the voltages of the COP and DOP pin are set to “H”, and its delay time is in the

(within 10

μs) from the initial state, the voltages of the COP and DOP pin are set to “H”, and its delay time is in the