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ADIS16445/PCBZ Datasheet(PDF) 14 Page - Analog Devices |
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ADIS16445/PCBZ Datasheet(HTML) 14 Page - Analog Devices |
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14 / 22 page ![]() ADIS16445 Data Sheet Rev. F | Page 14 of 22 SYSTEM FUNCTIONS GLOBAL COMMANDS The GLOB_CMD register in Table 19 provides trigger bits for software reset, flash memory management, and calibration control. Start each of these functions by writing a 1 to the assigned bit in GLOB_CMD. After completing the task, the bit automati- cally returns to 0. For example, set GLOB_CMD[7] = 1 (DIN = 0xBE80) to initiate a software reset. Set GLOB_CMD[3] = 1 (DIN = 0xBE08) to back up the user register contents in nonvolatile flash. This sequence includes loading the control registers with the data in their re- spective flash memory locations prior to producing new data. Table 19. GLOB_CMD (Base Address = 0x3E), Write Only Bits Description (Default = 0x0000) [15:8] Not used 7 Software reset [6:4] Not used 3 Flash update 2 Not used 1 Factory calibration restore 0 Gyroscope bias correction PRODUCT IDENTIFICATION The PROD_ID register in Table 22 contains the binary equivalent of 16,445. It provides a product-specific variable for systems that need to track this in their system software. The LOT_ID1 and LOT_ID2 registers in Table 20 and Table 21, respectively, combine to provide a unique, 32-bit lot identification code. The SERIAL_NUM register in Table 23 contains a binary num- ber that represents the serial number on the device label. The assigned serial numbers in SERIAL_NUM are lot specific. Table 20. LOT_ID1 (Base Address = 0x52), Read Only Bits Description [15:0] Lot identification, binary code Table 21. LOT_ID2 (Base Address = 0x54), Read Only Bits Description [15:0] Lot identification, binary code Table 22. PROD_ID (Base Address = 0x56), Read Only Bits Description (Default = 0x403D) [15:0] Product identification = 0x403D (16,445) Table 23. SERIAL_NUM (Base Address = 0x58), Read Only Bits Description [15:12] Reserved [11:0] Serial number, 1 to 4094 (0xFFE) SELF-TEST FUNCTION The MSC_CTRL register in Table 24 provides a self-test function for the gyroscopes and accelerometers. This function allows the user to verify the mechanical integrity of each MEMS sensor. When enabled, the self-test applies an electrostatic force to each internal sensor element, which causes them to move. The move- ment in each element simulates its response to actual rotation/ acceleration and generates a predictable electrical response in the sensor outputs. Set MSC_CTRL[10] = 1 (DIN = 0xB504) to activate the internal self-test routine, which compares the response to an expected range of responses and reports a pass/fail response to DIAG_STAT[5]. If this bit is high, review DIAG_STAT[15:10] to identify the failing sensor. Table 24. MSC_CTRL (Base Address = 0x34), Read/Write Bits Description (Default = 0x0006) [15:12] Not used 11 Checksum memory test (cleared upon completion)1 1 = enabled, 0 = disabled 10 Internal self-test (cleared upon completion)1 1 = enabled, 0 = disabled [9:8] Do not use, always set to 00 7 Not used 6 Point of percussion, see Figure 21 1 = enabled, 0 = disabled [5:3] Not used 2 Data ready enable 1 = enabled, 0 = disabled 1 Data ready polarity 1 = active high when data is valid 0 = active low when data is valid 0 Data ready line select 1 = DIO2, 0 = DIO1 1 The bit is automatically reset to 0 after finishing the test. |
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