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DDC232 Datasheet(PDF) 13 Page - Texas Instruments

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Part # DDC232
Description  32-Channel, Current-Input Analog-to-Digital Converter
PDF  34 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

DDC232 Datasheet(HTML) 13 Page - Texas Instruments

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DDC232
www.ti.com
SBAS331D – AUGUST 2004 – REVISED APRIL 2010
Table 7. Configuration Register
Bit 11
Bit 10
Bit 9
Bit 8
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
Range[2]
Range[1]
Range[0]
Format
Version
Clk_4x
0
0
0
0
0
Test
Bits 11–9
Range[2:0]. Full-scale range.
000: 12.5pC
100: 200pC
001: 50pC
101: 250pC
010: 100pC
110: 300pC
011: 150pC
111: 350pC (default)
Bit 8
Format. Data output format. This bit selects how many bits are used in the data output word.
0: 16-Bit Output
1: 20-Bit Output (default)
Bit 7
Version. Device version setting.
Must be set to '0' for DDC232C
Must be set to '1' for DDC232CK
Bit 6
Clk_4x. System clock divider. The Clk_4x input enables an internal divider on the system clock.
When Clk_4x = 1, the system clock is divided by 4. This allows a 4X faster system clock, which
in turn provides a finer quantization of the integration time because the CONV signal needs to be
synchronized with the system clock for the best performance.
0: Internal Clock Divider = 1 (default)
1: Internal Clock Divider = 4
Clk_4x BIT
CLK DIVIDER VALUE
CLK FREQUENCY
INTERNAL CLOCK FREQUENCY
0
1
5MHz
5MHz
1
4
20MHz
5MHz
Bits 5–1
These bits must be set to '0'.
Bit 0
Test. Diagnostic test mode enable. When Test mode is used, the inputs (IN1 through IN32) are
disconnected from the DDC232 integrators to enable the user to measure a zero input signal
regardless of the current supplied to the inputs. Test mode works with both Continuous and
Noncontinuous modes.
0: Test Mode Off (default)
1: Test Mode On
Copyright © 2004–2010, Texas Instruments Incorporated
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