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AD9671EBZ Datasheet(PDF) 39 Page - Analog Devices

Part # AD9671EBZ
Description  Octal Ultrasound AFE with Digital Demodulator
PDF  61 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

AD9671EBZ Datasheet(HTML) 39 Page - Analog Devices

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AD9671
Data Sheet
Rev. A| Page 38 of 60
SDIO Pin
The SDIO pin is required to operate the SPI. The SDIO pin has
an internal 30 kΩ pull-down resistor that pulls it low and is only
1.8 V tolerant. To drive the SDIO pin from a 3.3 V logic level, insert
a 1 kΩ resistor in series with this pin to limit the current.
SCLK Pin
The SCLK pin is required to operate the SPI. The SCLK pin has
an internal 30 kΩ pull-down resistor that pulls it low and is only
1.8 V tolerant. To drive the SCLK pin from a 3.3 V logic level,
insert a 1 kΩ resistor in series with this pin to limit the current.
CSB Pin
The CSB pin is required to operate the SPI. The CSB pin has an
internal 70 kΩ pull-up resistor that pulls it high and is only 1.8 V
tolerant. To drive the CSB pin from a 3.3 V logic level, insert a
1 kΩ resistor in series with this pin to limit the current.
RBIAS Pin
To set the internal core bias current of the ADC, place a resistor
nominally equal to 10.0 kΩ to ground at the RBIAS pin. Using a
resistor other than the recommended 10.0 kΩ resistor for RBIAS
degrades the performance of the device. Therefore, use at least a
1% tolerance on this resistor to achieve consistent performance.
VREF Pin
A stable and accurate 0.5 V voltage reference is built into the
AD9671. This voltage reference is amplified internally by a factor of
2, setting VREF to 1.0 V, which results in a full-scale differential
input span of 2.0 V p-p for the ADC. VREF is set internally by
default, but the user can drive the VREF pin externally with a
1.0 V reference to achieve more accuracy. However, the AD9671
does not support ADC full-scale ranges less than 2.0 V p-p.
When applying the decoupling capacitors to the VREF pin, use
ceramic, low equivalent series resistance (ESR) capacitors. Ensure
that these capacitors are near the reference pin and on the same
layer of the PCB as the AD9671. The VREF pin must have both
a 0.1 μF capacitor and a 1 μF capacitor that are connected in
parallel to analog ground. These capacitor values are recommended
for the ADC to properly settle and acquire the next valid sample.
GPOx Pins
Use the general-purpose output pins, GPO0, GPO1, GPO2, and
GPO3, in a system to provide programmable inputs to other chips
in the system. The value of each pin is set via Address 0x00E to
either Logic 0 or Logic 1 (see Table 33).
ADDRx Pins
Use the chip address pins to address individual AD9671 devices in
a system. Chip address mode is enabled using Address 0x115,
Bit 5 (see Table 33). If the value written to Bits[4:0] matches the
value on the chip address bit pins (ADDR4 to ADDR0), the device
is selected and any subsequent SPI writes or reads to addresses
indicated as chip registers are written only to that device. If chip
address mode is disabled, write all addresses regardless of the value
on the address pins.
TX_TRIG± Pins
The TX_TRIG± function has several uses within the AD9671
and is initiated with an external hardware trigger either on the TX_
TRIG± pins or by a software trigger by setting Address 0x10C, Bit 5
to 1. The hardware trigger has the advantage of guaranteed
synchronous triggering of multiple AD9671 devices in a system.
The setup and hold time for each TX_TRIG± hardware input is
given in Table 3 as 1 ns. Due to the asynchronous SPI function,
the software trigger cannot guarantee synchronization of multiple
AD9671 devices. If the TX_TRIG± hardware trigger is not used,
tie the TX_TRIG± pins in a low logic state.
The TX_TRIG± function is used to reset circuits in the digital
demodulator and decimator (see the Baseband Demodulator
and Decimator section), initiate the advanced power mode (see
the Advanced Power Control section), and synchronize the data
serialization in the JESD204B block (see the JESD204B
Overview section).
ANALOG TEST TONE GENERATION
The AD9671 can generate analog test tones that the user can
then switch to the input of the LNA of each channel for channel
gain calibration. The test tone amplitude at the LNA output is
dependent on LNA gain, as shown in Table 23.
Table 23. Test Signal Fundamental Amplitude at LNA Output
Address 0x116[3:2],
Analog Test Tones
LNA Gain
15.6 dB
LNA Gain
17.9 dB
LNA Gain
21.6 dB
00 (default)
80 mV p-p
98 mV p-p
119 mV p-p
01
160 mV p-p
196 mV p-p
238 mV p-p
10
320 mV p-p
391 mV p-p
476 mV p-p
11
Reserved
Reserved
Reserved
Calculate the test signal amplitude at the input to the ADC
given the LNA gain, attenuator control voltage, and the PGA
gain. Table 24 and Table 25 list example calculations.
Table 24. Test Signal Fundamental Amplitude at ADC Input,
VGAIN = 0 V, PGA Gain = 21 dB
Address 0x116[3:2],
Analog Test Tones
LNA Gain
15.6 dB
LNA Gain
17.9 dB
LNA Gain
21.6 dB
00 (default)
−29 dBFS
−28 dBFS
−26 dBFS
01
−23 dBFS
−22 dBFS
−20 dBFS
10
−17 dBFS
−16 dBFS
−14 dBFS
11
Reserved
Reserved
Reserved
Table 25. Test Signal Fundamental Amplitude at ADC Input,
VGAIN = 0 V, PGA Gain = 30 dB
Address 0x116[3:2],
Analog Test Tones
LNA Gain
15.6 dB
LNA Gain
17.9 dB
LNA Gain
21.6 dB
00 (default)
−20 dBFS
−19 dBFS
−17 dBFS
01
−14 dBFS
−13 dBFS
−11 dBFS
10
−8 dBFS
−7 dBFS
−5 dBFS
11
Reserved
Reserved
Reserved



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