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K64F Datasheet(PDF) 21 Page - NXP Semiconductors

Part # K64F
Description  Kinetis K64F Sub-Family
PDF  85 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

K64F Datasheet(HTML) 21 Page - NXP Semiconductors

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Table 13. Thermal attributes (continued)
Board type
Symbol
Descriptio
n
144 LQFP
144
MAPBGA
121
XFBGA
100 LQFP
Unit
Notes
junction to
case
ΨJT
Thermal
characteriza
tion
parameter,
junction to
package top
outside
center
(natural
convection)
2
0.9
0.2
2
°C/W
4
1. Determined according to JEDEC Standard JESD51-2, Integrated Circuits Thermal Test Method Environmental
Conditions—Natural Convection (Still Air), or EIA/JEDEC Standard JESD51-6, Integrated Circuit Thermal Test
Method Environmental Conditions—Forced Convection (Moving Air).
2. Determined according to JEDEC Standard JESD51-8, Integrated Circuit Thermal Test Method Environmental
Conditions—Junction-to-Board.
3. Determined according to Method 1012.1 of MIL-STD 883, Test Method Standard, Microcircuits, with the cold plate
temperature used for the case temperature. The value includes the thermal resistance of the interface material
between the top of the package and the cold plate.
4. Determined according to JEDEC Standard JESD51-2, Integrated Circuits Thermal Test Method Environmental
Conditions—Natural Convection (Still Air).
3 Peripheral operating requirements and behaviors
3.1 Core modules
3.1.1 Debug trace timing specifications
Table 14. Debug trace operating behaviors
Symbol
Description
Min.
Max.
Unit
Tcyc
Clock period
Frequency dependent
MHz
Twl
Low pulse width
2
ns
Twh
High pulse width
2
ns
Tr
Clock and data rise time
3
ns
Tf
Clock and data fall time
3
ns
Ts
Data setup
1.5
ns
Th
Data hold
1
ns
Peripheral operating requirements and behaviors
Kinetis K64F Sub-Family Data Sheet, Rev. 7, 11/2016
21
NXP Semiconductors



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