ISO1640 datasheet(32/45 Pages) TI

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device and high voltage is applied between the two sides; see Figure 9-8 for TDDB test setup. The insulation

breakdown data is collected at various high voltages switching at 60 Hz over temperature. For basic insulation,

VDE standard requires the use of a TDDB projection line with failure rate of less than 1000 part per million

(ppm). For reinforced insulation, VDE standard requires the use of a TDDB projection line with failure rate of less

than 1 part per million (ppm).

Even though the expected minimum insulation lifetime is 20 years, at the specified working isolation voltage,

VDE basic and reinforced certifications require additional safety margin of 20% for working voltage. For basic

certification, device lifetime requires a safety margin of 30% translating to a minimum required insulation lifetime

of 26 years at a working voltage that is 20% higher than the specified value. For reinforced insulation, device

lifetime requires a safety margin of 87.5% translating to a minimum required insulation lifetime of 37.5 years at a

working voltage that is 20% higher than the specified value.

Insulation Lifetime Projection Data for ISO164x in 8-D Package and Insulation Lifetime Projection Data for

ISO164x in 16-DW Package show the intrinsic capability of the isolation barrier to withstand high voltage stress

over its lifetime. Based on the TDDB data, the intrinsic capability of the insulation is 450 VRMS with a lifetime

in excess of 100 years in the 8-D package and 1500 VRMS with a lifetime in excess of 135 years in the 16-DW

package. Other factors, such as package size, pollution degree, material group, etc. can further limit the working

voltage of the component. At the lower working voltages, the corresponding insulation lifetime is much longer

than 100 years in the 8-D package and 135 years in the 16-DW package.

DUT

Vcc 2

Vcc 1

GND 1

GND 2

Ovenat150°C

TimeCounter

> 1 mA

Figure 9-8. Test Setup for Insulation Lifetime Measurement

ISO1640, ISO1641

SLLSFC2B – FEBRUARY 2020 – REVISED MAY 2021

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ISO1640 Datasheet(PDF) 32 Page - Texas Instruments