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FXLS93333 Datasheet(PDF) 36 Page - NXP Semiconductors |
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FXLS93333 Datasheet(HTML) 36 Page - NXP Semiconductors |
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36 / 254 page  NXP Semiconductors FXLS9xxxx Dual channel inertial sensor VBUS_I_L_min ≤ (VBUS_I – VSS) ≤ VBUS_I_H_min, TL ≤ TA ≤ TH, ΔT ≤ 25 °C/min, unless otherwise specified # Characteristic Symbol Min Typ Max Units Test notes Self-test Response Time: Self-test Activation/Deactivation to 99 % / 1 % gST 38157 High g Lateral, LPF = 188 Hz, 4-Pole tST_Resp_HiX_188_4 3210 3380 3600 µs 7, 8 Medium g, Z-Axis Self-test Response Time: Self-test Activation/Deactivation to 99 % / 1 % gST 38158 Medium g Z-Axis, LPF = 800 Hz, 4-Pole tST_Resp_MedZ_800_4 750 795 1010 µs 7, 8 44637 Medium g Z-Axis, LPF = 1500 Hz, 4-Pole tST_Resp_MedZ_1500_4 395 415 710 µs 7, 8 Self-test Response Time: Self-test Activation/Deactivation to 99 % / 1 % gST 38159 Medium g Z-Axis, LPF = 400 Hz, 4-Pole tST_Resp_MedZ_400_4 1510 1590 1810 µs 7, 8 38160 Medium g Z-Axis, LPF = 400 Hz, 3-Pole tST_Resp_MedZ_400_3 1420 1490 1700 µs 7, 8 38161 Medium g Z-Axis, LPF = 180 Hz, 2-Pole tST_Resp_MedZ_180_2 3030 3190 3470 µs 7, 8 Self-test Response Time: Self-test Activation/Deactivation to 99 % / 1 % gST 38162 Medium g Z-Axis, LPF = 300 Hz, 4-Pole tST_Resp_MedZ_300_4 2010 2120 2360 µs 7, 8 Self-test Response Time: Self-test Activation/Deactivation to 99 % / 1 % gST 38163 Medium g Z-Axis, LPF = 188 Hz, 4-Pole tST_Resp_MedZ_188_4 3210 3380 3680 µs 7, 8 High g, Z-Axis Self-test Response Time: Self-test Activation/Deactivation to 99 % / 1 % gST 38164 High g Z-Axis, LPF = 800 Hz, 4-Pole tST_Resp_HiZ_800_4 750 795 994 µs 7, 8 44638 High g Z-Axis, LPF = 1500 Hz, 4-Pole tST_Resp_HiZ_1500_4 395 415 675 µs 7, 8 Self-test Response Time: Self-test Activation/Deactivation to 99 % / 1 % gST 38165 High g Z-Axis, LPF = 400 Hz, 4-Pole tST_Resp_HiZ_400_4 1510 1590 1800 µs 7, 8 38166 High g Z-Axis, LPF = 400 Hz, 3-Pole tST_Resp_HiZ_400_3 1420 1490 1690 µs 7, 8 38167 High g Z-Axis, LPF = 180 Hz, 2-Pole tST_Resp_HiZ_180_2 3030 3190 3470 µs 7, 8 Self-test Response Time: Self-test Activation/Deactivation to 99 % / 1 % gST 38168 High g Z-Axis, LPF = 300 Hz, 4-Pole tST_Resp_HiZ_300_4 2010 2120 2360 µs 7, 8 Self-test Response Time: Self-test Activation/Deactivation to 99 % / 1 % gST 38169 High g Z-Axis, LPF = 188 Hz, 4-Pole tST_Resp_HiZ_188_4 3210 3380 3680 µs 7, 8 Table 40. Dynamic electrical characteristics - analog self-test response time...continued 10.18 Dynamic electrical characteristics - digital self-test response time VBUS_I_L_min ≤ (VBUS_I – VSS) ≤ VBUS_I_H_min, TL ≤ TA ≤ TH, ΔT ≤ 25 °C/min, unless otherwise specified # Characteristic Symbol Min Typ Max Units Test notes Self-test Response Time: Self-test Activation/Deactivation to Final Value 44639 LPF ≤ 60 Hz tDST_Resp_50 — — 50 ms 7, 8 Self-test Response Time: Self-test Activation/Deactivation to Final Value 44641 60 Hz ≤ LPF ≤ 200 Hz tDST_Resp_100 — — 25 ms 7, 8 Self-test Response Time: Self-test Activation/Deactivation to Final Value 44640 300 Hz ≤ LPF ≤ 1500 Hz tDST_Resp_400 — — 12 ms 7, 8 38176 Fixed Pattern Response Time: Self-test Activation/Deactivation tST_FP_Resp — — 100 µs 7, 8 Table 41. Dynamic electrical characteristics - digital self-test response time FXLS9xxxx All information provided in this document is subject to legal disclaimers. © NXP B.V. 2021. All rights reserved. Product data sheet Rev. 6 — 8 February 2021 36 / 254 |
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