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PCM1820 Datasheet(PDF) 7 Page - Texas Instruments |
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PCM1820 Datasheet(HTML) 7 Page - Texas Instruments |
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7 / 41 page ![]() at TA = 25°C, AVDD = 3.3 V, IOVDD = 3.3 V, fIN = 1-kHz sinusoidal signal, fS = 48 kHz, 32-bit audio data, BCLK = 256 × fS, TDM slave mode (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIL Low-level digital input logic voltage threshold All digital pins except FMT0, IOVDD 1.8-V operation –0.3 0.30 × IOVDD V All digital pins except FMT0, IOVDD 3.3-V operation –0.3 0.8 FMT0 Pin –0.3 0.8 V VIH High-level digital input logic voltage threshold All digital pins except FMT0, IOVDD 1.8-V operation 0.7 × IOVDD IOVDD + 0.3 V All digital pins except FMT0, IOVDD 3.3-V operation 2.1 IOVDD + 0.3 FMT0 Pin 2.1 AVDD + 0.3 V VOL Low-level digital output voltage All digital pins, IOL = –2 mA, IOVDD 1.8-V operation 0.45 V All digital pins, IOL = –2 mA, IOVDD 3.3-V operation 0.4 VOH High-level digital output voltage All digital pins, IOH = 2 mA, IOVDD 1.8-V operation IOVDD – 0.45 V All digital pins, IOH = 2 mA, IOVDD 3.3-V operation 2.4 IIH Input logic-high leakage for digital inputs All digital pins, input = IOVDD –5 0.1 5 µA IIL Input logic-low leakage for digital inputs All digital pins, input = 0 V –5 0.1 5 µA CIN Input capacitance for digital inputs All digital pins 5 pF RPD Pulldown resistance for digital I/O pins when asserted on 20 kΩ TYPICAL SUPPLY CURRENT CONSUMPTION IAVDD Current consumption with all Clocks disabled AVDD = 3.3 V, internal AREG 0.5 mA IIOVDD All external clocks stopped, IOVDD = 3.3 V 0.5 µA IIOVDD All external clocks stopped, IOVDD = 1.8 V 0.3 IAVDD Current consumption with ADC 2-channel operating at fS 16-kHz, BCLK = 256 × fS and DRE disabled AVDD = 3.3 V, internal AREG 11.9 mA IIOVDD IOVDD = 3.3 V 0.05 IIOVDD IOVDD = 1.8 V 0.02 IAVDD Current consumption with ADC 2-channel operating at fS 48-kHz, BCLK = 256 × fS and DRE disabled AVDD = 3.3 V, internal AREG 12.9 mA IIOVDD IOVDD = 3.3 V 0.1 IIOVDD IOVDD = 1.8 V 0.05 IAVDD Current consumption with ADC 2-channel operating at fS 48-kHz, BCLK = 256 × fS and DRE enabled AVDD = 3.3 V, internal AREG 14 mA IIOVDD IOVDD = 3.3 V 0.1 IIOVDD IOVDD = 1.8 V 0.05 (1) Ratio of output level with 1-kHz full-scale sine-wave input, to the output level with the AC signal input shorted to ground, measured A-weighted over a 20-Hz to 20-kHz bandwidth using an audio analyzer. (2) All performance measurements done with a 20-kHz, low-pass filter and, where noted, an A-weighted filter. Failure to use such a filter may result in higher THD and lower SNR and dynamic range readings than shown in the Electrical Characteristics. The low-pass filter removes out-of-band noise, which, although not audible, may affect dynamic specification values. (3) For best distortion performance, use input AC-coupling capacitors with a low-voltage-coefficient. (4) Gain drift =gain_variation(in temperature range)/ typical gain value(gain at room temperature) / temperature range × 106 measured with gain in linear scale. (5) Phase drift =phase_deviation(in temperature range)/ (temperature range). 7.6 Timing Requirements: TDM or I2S Interface at TA = 25°C, IOVDD = 3.3 V or 1.8 V and 20-pF load on all outputs (unless otherwise noted) MIN NOM MAX UNIT t(BCLK) BCLK period 40 ns tH(BCLK) BCLK high pulse duration (1) 25 ns tL(BCLK) BCLK low pulse duration (1) 25 ns tSU(FSYNC) FSYNC setup time 8 ns tHLD(FSYNC) FSYNC hold time 8 ns tr(BCLK) BCLK rise time 10% - 90% rise time(2) 10 ns www.ti.com PCM1822 SBASAK0 – DECEMBER 2020 – REVISED MAY 2022 Copyright © 2022 Texas Instruments Incorporated Submit Document Feedback 7 Product Folder Links: PCM1822 |
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