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ZAMC4100 Datasheet(PDF) 140 Page - Renesas Technology Corp |
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ZAMC4100 Datasheet(HTML) 140 Page - Renesas Technology Corp |
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140 / 156 page ![]() ZAMC4100 Datasheet © 2016 Integrated Device Technology, Inc. 140 January 26, 2016 5 ZAMC4100 Protection and Diagnostic Features This section is a summary description of all protection and diagnostic features available in the ZAMC4100. The description is structured similarly to the way the diagnostics are handled: event à detection à capturing à reaction 5.1. Full-Time Diagnostic and Protection Features It includes features that might always be present whenever the system is powered and do not interrupt or influence the normal operation. They are executed in the background automatically and interrupt the normal operation only if a specific event occurs. Some of these features might be masked by the software and MCU; others cannot be masked (mainly protection functions). 5.1.1. Over-Current (OC) Protection Event The current through one of the output driver transistors is above the maximum specified value for the corresponding output. Detection Continuous comparison with a fixed reference level with pure analog circuitry; possible measuring with the ADC in parallel; invoked by the software. Capturing Captured in the digital SBC. Reaction Response in both digital and analog domains: 1) The driver of this transistor automatically limits the current in order to avoid silicon damage. Important: This reaction is implemented as analog circuitry, and it cannot be masked. 2) An over-current interrupt flag is set in the digital SBC, and the drivers are automatically disabled. 5.1.2. Over-Load (OVL) Detection using the ADC Event The current through one of the output driver transistors is above a certain limit (OVL level) that is considered as a maximum current allowed for the driven load. The OVL level is always below the OC level. Detection Initiated by the MCU firmware. The measured current by the ADC is compared with the OVL level in the MCU or with the ADC comparator. Capturing The event is captured in the MCU. Reaction A response should be implemented in the MCU software depending on the application requirements. |
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